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Journal ArticleDOI

Generation of microwave radiation in the tunneling junction of a scanning tunneling microscope.

W. Krieger, +3 more
- 15 May 1990 - 
- Vol. 41, Iss: 14, pp 10229-10232
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This article is published in Physical Review B.The article was published on 1990-05-15. It has received 71 citations till now. The article focuses on the topics: Scanning tunneling spectroscopy & Spin polarized scanning tunneling microscopy.

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Journal ArticleDOI

Enhanced dielectric contrast in scattering-type scanning near-field optical microscopy

TL;DR: In this paper, the authors show that the coupling of probe dipole and its image in the sample causes a steep increase of scattering cross-sections at small probe-sample distances.
Journal ArticleDOI

High-frequency near-field microscopy

TL;DR: In this article, the authors provide a brief historical review of how near-field microscopy has developed, including a review of visible and infrared near field microscopy in the context of the main theme, the principles and applications of near-Field microscopy using millimeter to micrometer electromagnetic waves.
Journal ArticleDOI

Nanometer thin-film Ni-NiO-Ni diodes for detection and mixing of 30 THz radiation

TL;DR: In this article, the authors reported the first application of thin-film MOM diodes for detection of CO 2 -laser radiation with high frequency up to 176 GHz.
Journal ArticleDOI

Photoassisted scanning tunneling microscopy

TL;DR: A review of light-induced effects in tunneling microscopy can be found in this article, where the authors discuss thermal effects, nonlinear effects, field enhancement at the STM tip, various effects on semiconductor surfaces, excitation of surface plasmons, detection of photoelectrons, spin-polarized tunneling, local optical spectroscopy, the use of ultrashort laser pulses for time-resolved STM, and the combination of STM and scanning near-field optical microscopy.
Journal ArticleDOI

Ultrafast scanning probe microscopy

TL;DR: In this article, the response of the tunneling gap of a scanning tunneling microscope to excitation by a sub-picosecond electrical pulse was measured, and the potential of this powerful technique for studying ultrafast dynamical phenomena on surfaces with atomic resolution and mesoscopic electronic device physics was discussed.
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