Journal ArticleDOI
High-Frequency Measurement of Q-Factors of Ceramic Chip Capacitors
J. Maher,R. Jacobsen,R. Lafferty +2 more
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TLDR
In this paper, a high-Q transmission line has been constructed, and a mathematical system has been devised for employing that line in a resonant mode to determine capacitor parameters, and particularly Q-factor, at the range up to and including microwave frequencies.Abstract:
No reliable instrumentation systems have been available for the measurement of capacitor properties, particularly Q-factor, in applications requiring operation in the 100-1000 MHz range. The production of large numbers of multilayer ceramic chip capacitors for such special use is a very recent development. The need for reliable measurement equipment is increasing both for purposes of device evaluation and device development. A high-Q transmission line has been constructed, and a mathematical system has been devised for employing that line in a resonant mode to determine capacitor parameters, and particularly Q-factor, at the range up to and including microwave frequencies. The device produces accurate reliable data. The equipment can be reproduced and the system can be used in analysis and evaluation with a degree of confidence not possible in the past.read more
Citations
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Journal ArticleDOI
A substrate-dependent CAD model for ceramic multilayer capacitors
TL;DR: In this article, a substrate-dependent lumped-element model for multilayer capacitors is presented, which is suitable for microstrip-mounted components, and has been applied up to 10 GHz for values from 0.5 pF to 0.47 /spl mu/F.
Journal ArticleDOI
Fault Modeling and Multi-Tone Dither Scheme for Testing 3D TSV Defects
TL;DR: A new test technique is provided for detecting defects in Through Silicon Via (TSV) in 3-D ICs and a substrate-dependent equivalent electrical model for TSVs is presented, finding a significant difference in peak-to-average ratio between defect-free and defective TSVs.
Journal ArticleDOI
Capacitor loss at radio frequencies
TL;DR: In this article, a means for characterizing the effective series resistance (ESR) of low loss capacitors at radio frequencies with only a few measurements is suggested, and it is necessary that the dielectric have a known loss/frequency relationship.
Proceedings ArticleDOI
3-D Copper based TSV for 60-GHz applications
TL;DR: In this article, the authors present modeling, simulation and experimental measurements of copper-based TSV for 60 GHz applications and validate the electrical performance of the TSV with varying data rates in addition to providing eye diagram analysis.
Journal ArticleDOI
Measurement of the Characteristics of High-Q Ceramic Capacitors
M. Ingalls,G. Kent +1 more
TL;DR: In this paper, it is shown that the first self-resonance, when viewed in terms of a series R, L, C equivalent circuit, is a poorly defined quantity.
References
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Journal ArticleDOI
Impedance Measurements of Microwave Lumped Elements from 1 to 12 GHz
TL;DR: In this paper, the impedance measurement of small, microwave lumped elements of the order of 1 mm has been extended up to 12 GHz by a technique in which the frequency and Q of a resonant transmission line are perturbed by the connection of a lumped element.