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Proceedings ArticleDOI

In-field test of safety-critical systems: is functional test a feasible solution?

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TLDR
This paper overviews the state of the art in the area of test programs able to detect faults, and discusses the trends in the region.
Abstract
The growing usage of electronic systems in safety- and mission-critical applications, together with the increased susceptibility of electronic devices to faults arising during the operational phase mandate for the availability of effective solutions able to face the effects of these faults. When the target system includes a processor, one possible solution is based on running suitable test programs able to detect the occurrence of faults. This solution provides several advantages (e.g., in terms of flexibility, IP protection, and defect coverage), although it is limited by the cost for developing the test programs. This paper overviews the state of the art in the area, and discusses the trends in the area.

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Citations
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Proceedings ArticleDOI

Design-to-test approach for black-box testing of programmable controllers

TL;DR: A design-to-test approach is proposed to improve the testability of programmable controllers and reduce overhead during the testing phase, under the premise that the nominal behavior of a system is guaranteed to remain unchanged during normal execution.

New Techniques for Emulating Fault Attacks

TL;DR: New fault emulation techniques for faults in combinational and sequential logic are presented, which allow to model arbitrary fault attacks in industrial designs without performance loss compared to fault-free emulations and enables efficient pre-silicon security verification.
References
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Journal ArticleDOI

Test Generation for Microprocessors

TL;DR: In this paper, a general graph-theoretic model is developed at the register transfer level which takes the microprocessor organization and the instruction set as parameters and generate tests to detect all the faults in the fault model.
Journal ArticleDOI

Microprocessor Software-Based Self-Testing

TL;DR: A taxonomy for different SBST methodologies according to their test program development philosophy is proposed, and research approaches based on SBST techniques for optimizing other key aspects are summarized.
Proceedings ArticleDOI

FRITS - a microprocessor functional BIST method

TL;DR: A novel functional Built-in-Self-Test (BIST) method for microprocessors is described, based on the fundamental principle that complex chips have embedded functionality that can be used to implement a comprehensive self-test strategy.
Journal ArticleDOI

Automatic test program generation: a case study

TL;DR: This work focuses on simulation-based design validation performed at the behavioral register-transfer level, where designers typically write assertions inside hardware description language (HDL) models and run extensive simulations to increase confidence in device correctness.
Journal ArticleDOI

Software-Based Self-Test of Set-Associative Cache Memories

TL;DR: The main contribution of this work lies in the possibility of applying state-of-the-art memory test algorithms to embedded cache memories without introducing any hardware or performance overheads and guaranteeing the detection of typical faults arising in nanometer CMOS technologies.
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