Journal ArticleDOI
Measurement of lens aberrations by means of image displacements in beam-tilt series
A. Steinecker,Werner Mader +1 more
Reads0
Chats0
TLDR
The experimental procedure using amorphous carbon is described and errors in measuring beam-tilt angles, magnifications and image displacements can be kept sufficiently small to achieve the required accuracy.About:
This article is published in Ultramicroscopy.The article was published on 2000-04-01. It has received 21 citations till now. The article focuses on the topics: Contrast transfer function & Spherical aberration.read more
Citations
More filters
Journal ArticleDOI
A new method for the determination of the wave aberration function for high resolution TEM
Journal ArticleDOI
A new method for the determination of the wave aberration function for high-resolution TEM.: 2. Measurement of the antisymmetric aberrations
TL;DR: A new method is presented for the determination of the antisymmetric coefficients of the wave aberration function from a tableau of tilted illumination images using a phase correlation function and phase contrast index calculated from a short focus series acquired at each tilt.
Journal ArticleDOI
Structure projection reconstruction from through-focus series of high-resolution transmission electron microscopy images
TL;DR: A structure projection reconstruction method based on contrast transfer function correction of through-focus series of high-resolution transmission electron microscopy images is presented and Influences of experimental parameters for imaging and effects of crystal thickness on reconstruction are discussed.
Journal ArticleDOI
Aberration-compensated large-angle rocking-beam electron diffraction
TL;DR: Results obtained by a recently developed self-calibrating acquisition software which compensates for aberration-induced probe shifts during the acquisition of LARBED patterns and keeps the probe within a few nm, while covering a tilt range from 0 to 100 mrad.
Journal ArticleDOI
Precise and unbiased estimation of astigmatism and defocus in transmission electron microscopy
Miloš Vulović,Miloš Vulović,Franken Erik Michiel,Raimond B. G. Ravelli,Lucas J. van Vliet,Bernd Rieger +5 more
TL;DR: In this paper, a new Thon ring averaging method was proposed to estimate the defocus and twofold astigmatism of weak phase objects in the presence of spherical aberration.
References
More filters
Journal ArticleDOI
EMS-A software package for electron diffraction analysis and HREM image simulation in materials science
TL;DR: EMS as mentioned in this paper is a set of computer programs which have been developed not only for the simulation and analysis of high-resolution Electron Microscopy images, but also for the analysis of diffraction patterns.
Journal ArticleDOI
A spherical-aberration-corrected 200 kV transmission electron microscope
TL;DR: In this paper, a hexapole corrector system was constructed for compensation of the spherical aberration of the objective lens of a transmission electron microscope, and an improvement of the point resolution from 0.24nm to better than 0.14nm was realized.
Journal ArticleDOI
Phase retrieval through focus variation for ultra-resolution in field-emission transmission electron microscopy.
TL;DR: A dramatic improvement of the high-resolution performance of the electron microscope beyond the usual «point-to-point» resolution has been realized: Experiments on a 200-kV microscope with a point resolution of 0.24 nm reveal reconstructed information down to 0.
Journal ArticleDOI
Maximum-likelihood method for focus-variation image reconstruction in high resolution transmission electron microscopy
TL;DR: In this article, a solution of the maximum-likelihood (MAL) equations for image reconstruction is derived in which the coupling between the wave function and its complex conjugate is accounted for.
Journal ArticleDOI
Electron holography approaching atomic resolution
TL;DR: In this article, an electron biprism was used to record the image plane off-axis holograms at atomic resolution by means of an electron-biprocessor, and numerical and light-optical reconstruction schemes were compared.
Related Papers (5)
Determination of Image Aberrations in High-resolution Electron Microscopy using Diffractogram and Cross-correlation Methods
D. Typke,K. Dierksen +1 more
Coma-free alignment of high-resolution electron microscopes with the aid of optical diffractograms
Measurement of the spherical aberration coefficient of transmission electron microscopes by beam-tilt-induced image displacements
A.J. Koster,A.F. de Jong +1 more