Measurement of refractive index and thickness of transparent plate by dual-wavelength interference
TLDR
An accurate and efficient method for measuring the refractive indices of a transparent plate by analyzing the transmitted intensity versus angle of incidence and independent determination of the absolute index of refraction and the thickness with a relative uncertainty of 10(-5).Abstract:
We developed an accurate and efficient method for measuring the refractive indices of a transparent plate by analyzing the transmitted intensity versus angle of incidence. By using two different wavelengths, we resolved the 2pi-ambiguity inherent to the phase measurement involving a thick medium, leading to independent determination of the absolute index of refraction and the thickness with a relative uncertainty of 10(-5). The validity and the accuracy of our method were confirmed with a standard reference material. Furthermore, our method is insensitive to environmental perturbations, and simple to implement, compared to the conventional index measurement methods providing similar accuracy.read more
Citations
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A Review of Thickness Measurements of Thick Transparent Layers Using Optical Interferometry
TL;DR: In this article, a review of optical interferometric methods for measuring thicknesses of thick transparent layers are introduced through a discussion of basic principles and applications, with consideration of optical layouts and analysis methods of interference signals.
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Measurements of refractive indices and thermo-optical coefficients using a white-light Michelson interferometer.
TL;DR: The accuracy of the methodology used for n was almost 10-6, enabling precise spectroscopic characterization of materials across a wide spectral range.
Journal ArticleDOI
Simultaneous measurement of refractive-index and thickness for optical materials by laser feedback interferometry
TL;DR: A novel approach based on the Nd:YAG microchip laser feedback interferometry (MLFI) with 1064 nm wavelength for eliminating the air flow and electric-heating influence and the heterodyne modulation and quasi-common path in the MLFI are used.
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Absolute optical thickness measurement of transparent plate using excess fraction method and wavelength-tuning Fizeau interferometer
TL;DR: Two kinds of optical thicknesses, measured by discrete Fourier analysis and the phase-shifting technique, were synthesized to obtain the optical thickness with respect to the ordinary refractive index using Sellmeier equation and least-square fitting.
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Dual-wavelength in-line phase-shifting interferometry based on two dc-term-suppressed intensities with a special phase shift for quantitative phase extraction.
TL;DR: To efficiently promote the phase retrieval in quantitative phase imaging, a new approach based on two intensities with dual wavelength after filtering the corresponding dc terms for each wavelength, in which a special phase shift is used.
References
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A temperature-dependent dispersion equation for congruently grown lithium niobate
G. J. Edwards,M. Lawrence +1 more
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Refractive-index measurement of bulk materials: prism coupling method.
TL;DR: A simple method of measuring refractive indices of bulk materials using a prism coupling procedure is described, showing the accuracy is comparable with that of minimum deviation method if the prism is well calibrated.
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Method for measuring the refractive index and the thickness of transparent plates with a lateral-shear, wavelength-scanning interferometer
TL;DR: A new method for measuring simultaneously the thickness and the refractive index of a transparent plate is proposed, based on a simple, variable lateral-shear, wavelength-scanning interferometer.
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Refractive index errors in the critical-angle and the Brewster-angle methods applied to absorbing and heterogeneous materials
TL;DR: In this paper, the critical angle of reflection is measured at the interface between the prism of known refractive index and the sample material of unknown refractive indices, and the error arising from the neglect of absorption and heterogeneity in the transparent sample interpretation of the critical angles is investigated.