Book ChapterDOI
Remote Education Experience on Learning IC Characterization/Production Test
Yves Bertrand,R. Lorival,Michel Robert,G. Cambon +3 more
- pp 127-130
TLDR
In this article, the authors proposed a method to test mixed analog-digital ICs using a built-in self-test (BIST) facility, which has been shown to reduce 50% of the manufacturing costs for some complex mixed-signal ICs.Abstract:
Electronics manufacturers are driven to produce new integrated circuits (IC’s) with higher quality in shorter production cycles (the well known time-to-market concept). In parallel, with the advent of submicron technologies digital circuits become more complex, with an increasing transistor-per-pin ratio making them hard-to-test without Design-For-Test (DFT) and Built-in Self-Test (BIST) facilities [1]. Also, during the past decade the production of mixed analog-digital IC’s have been dramatically developed due to the explosive growth of the multimedia and telecom markets and testing for quality assurance has proven to approach 50% of the manufacturing costs for some complex mixed-signal IC’s [2].read more
Citations
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Proceedings ArticleDOI
A successful distance-learning experience for IC test education
TL;DR: An original educational experience that has been set by French universities to respond to IC manufacturer needs for electronics engineers having a double design and test competence is described, equipped with a high performing up-to-date ATE representative of real industrial test tools.
Proceedings ArticleDOI
A remote access to engineering test facilities for the distant education of European microelectronics students
TL;DR: The European network for integrated circuit testing education as discussed by the authors addresses the shortage of skill in mixed-signal production testing by encouraging students at pre- and post-doctoral levels to attend innovative training courses in the field, jointly supported by industry.
Proceedings ArticleDOI
Making ATE accessible for academic institutions
W. Moorhead,Serge Demidenko +1 more
TL;DR: This paper identifies the requirements to implement a test engineering program in the university environment, the challenges that face both university and industry, and strategies that can be adopted to meet these requirements.
Proceedings ArticleDOI
European network for test education
TL;DR: The European network for test education described in this paper addresses the shortage of skills in mixed-signal production testing by encouraging students at pre- and post-doctoral levels to attend innovative training courses in the field.
Proceedings ArticleDOI
Test engineering education in Europe: the EuNICE-Test project
Yves Bertrand,Marie-Lise Flottes,L. Balado,Joan Figueras,Anton Biasizzo,Franc Novak,S. Di Carlo,P. Prinetto,N. Pricopi,Hans-Joachim Wunderlich,J.-P. Van der Heyden +10 more
TL;DR: In this paper, a European experience of education in industrial test of ICs and SoCs using remote testing facilities is presented, where the academic and industrial partners of the consortium to train engineers using the common test resources center (CRTC) hosted by LIRMM (Laboratoire d'Informatique, de Robotique et de Microelectronique de Montpellier, France).
References
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Book
Digital Systems Testing and Testable Design
TL;DR: The new edition of Breuer-Friedman's Diagnosis and Reliable Design ofDigital Systems offers comprehensive and state-ofthe-art treatment of both testing and testable design.
Journal ArticleDOI
Integrated circuit testing for quality assurance in manufacturing: history, current status, and future trends
TL;DR: In this article, the authors examine the developments in IC testing from the historic, current status and future view points and relate new test paradigms that have the potential to fundamentally alter the methods used to test mixed-signal and RF parts.