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Patent

Replacement metal gate and fabrication process with reduced lithography steps

TLDR
In this article, a layer of fill metal is used to protect the dielectric layer in the trenches, eliminating the need for some lithography steps, in turn reducing the overall cost and complexity of fabrication.
Abstract
Embodiments of the present invention provide a replacement metal gate and a fabrication process with reduced lithography steps. Using selective etching techniques, a layer of fill metal is used to protect the dielectric layer in the trenches, eliminating the need for some lithography steps. This, in turn, reduces the overall cost and complexity of fabrication. Furthermore, additional protection is provided during etching, which serves to improve product yield.

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Patent

Method of forming a structure on a substrate

TL;DR: In this article, the authors proposed a method of providing a structure by depositing a layer on a substrate in a reactor, which consisted of: introducing a silicon halide precursor in the reactor; introducing a reactant gas comprising oxygen in the reaction chamber; and, providing an energy source to create a plasma from the reactive gas so that the oxygen reacts with the first precursor in a layer comprising silicon dioxide.
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TL;DR: In this article, the first correction factor of a first contact type temperature sensor within a first reaction chamber utilizing a first temperature sensor and applying the first calibration factor to the first non-contact type temperature sensors to provide a first calibrated noncontact temperature sensor.
References
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Patent

Self-aligned contacts

TL;DR: In this article, the insulator-cap layer enables self-aligned contacts, allowing initial patterning of wider contacts that are more robust to patterning limitations, and a pair of diffusion regions adjacent to the pair of spacers.
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TL;DR: In this paper, the methods of filling features with tungsten and related systems and apparatus are described, including inside-out fill techniques as well as conformal deposition in features.
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Semiconductor device and manufacturing method thereof

TL;DR: In this article, a silicon nitride film (a first insulating film) is formed so as to cover a plurality of gate electrodes 3b, and then an ozone tetraethylorthosilicate (TEOS) film and a plasma TEOS film are laminated in order.
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Method of manufacturing semiconductor device

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