Journal ArticleDOI
Role of defects in determining the electrical properties of CdS thin films. I. Grain boundaries and surfaces
TLDR
In this paper, the relationship between the electronic properties of mobility and resistivity, and electron scattering from film defects in slowly deposited cadmium sulphide polycrystalline thin films is investigated.Abstract:
The relationship between the electronic properties of mobility and resistivity, and electron scattering from film defects in slowly deposited cadmium sulphide polycrystalline thin films is investigated. The correlation of these properties is accomplished in a direction parallel to the substrate (``in‐plane'') where the defects of interest are grain boundaries and surfaces. The Petritz (grain boundary) theory is incorporated with surface‐scattering theory to formulate a simple model which predicts the effect of these defects on the electron mobility. Typical values for the grain‐boundary potential and surface‐scattering length are 0.07 eV and 1100 A at a substrate temperature of 180°C for these glass‐deposited films. The mobility is found to depend strongly on grain size, which was a function of substrate temperature. Hall data are presented as a function of evaporation rate, substrate temperature, film thickness, and film temperature. Finally, the grain‐boundary potential is found to depend on the fabrication parameters, especially the deposition rate.read more
Citations
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Journal ArticleDOI
The Hall effect in polycrystalline and powdered semiconductors
J W Orton,M J Powell +1 more
TL;DR: In this article, a critical review of idealized two-phase geometrical models is given, which derive expressions for the resistivity and Hall coefficient of a composite material in terms of the properties of its constituents.
Journal ArticleDOI
Grain boundaries in semiconductors
TL;DR: In this article, a review of the available experimental and theoretical understanding on the structure and electronic properties of grain boundaries in semiconducting materials is presented, where high-resolution electron microscope images of interfaces are interpreted within the framework of the structural unit model of grain boundary, and the electronic properties are discussed with relation to the popular symmetric Schottky barrier model for charge trapping and potential barrier formation.
Journal ArticleDOI
Carrier transport in polycrystalline transparent conductive oxides: A comparative study of zinc oxide and indium oxide
Klaus Ellmer,R. Mientus +1 more
TL;DR: In this paper, the authors compared the dependences of the effective Hall mobility on the carrier concentration of indium-tin oxide and ITO and found that grain barriers limit the carrier mobility in ZnO for carrier concentrations as high as 2.
Journal ArticleDOI
Chemical bath deposition of CuxS thin films and their prospective large area applications
M T S Nair,P K Nair +1 more
TL;DR: In this article, a range of combination of rsquare operator approximately 30 Omega to 1 M Omega and T% (500 nm) approximately 1 to 65 and a color of reflected daylight (golden yellow, purple, blue, green, etc.) can be obtained from chemical baths constituted from copper(II) chloride, triethanolamine and thiourea at appropriate pH.
Journal ArticleDOI
The mechanism of photoconductivity in polycrystalline cadmium sulphide layers
TL;DR: In this paper, the mechanism of photoconductivity in polycrystalline CdS has been studied over the temperature range 100-300 K using Hall effect and conductivity measurements in the dark and under white light illumination.
References
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Journal ArticleDOI
Theory of Photoconductivity in Semiconductor Films
TL;DR: In this paper, the authors analyzed a model which incorporates the above characteristics of a photoconductive film, except for the space charge effects, and derived numerical values for responsivity, noise, and sensitivity.
Journal ArticleDOI
Electron Mobility Studies in Surface Space‐Charge Layers in Vapor‐Deposited CdS Films
TL;DR: In this article, the authors measured Hall and field-effect surface mobility in polycrystalline films of CdS of thickness 1000-4000 A. The Hall mobility was observed to increase exponentially with temperature from −80° to 120°C.
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