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Semiconductor device including a plurality of thin film transistors at least some of which have a crystalline silicon film crystal-grown substantially in parallel to the surface of a substrate for the transistor

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TLDR
In this article, an active matrix type liquid crystal display whose thin film transistors (TFTs) in the peripheral circuit section are composed of the crystalline silicon film whose crystal is grown in the direction parallel to the flow of carriers and whose TFTs in the picture element section are made of the amorphous silicon film can be obtained.
Abstract
Nickel is introduced to a predetermined region of a peripheral circuit section, other than a picture element section, on an amorphous silicon film to crystallize from that region. After forming gate electrodes and others, sources, drains and channels are formed by doping impurities, and laser is irradiated to improve the crystallization. After that, electrodes/wires are formed. Thereby an active matrix type liquid crystal display whose thin film transistors (TFT) in the peripheral circuit section are composed of the crystalline silicon film whose crystal is grown in the direction parallel to the flow of carriers and whose TFTs in the picture element section are composed of the amorphous silicon film can be obtained.

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Citations
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Semiconductor device, and manufacturing method thereof

TL;DR: In this article, the oxide semiconductor film has at least a crystallized region in a channel region, which is defined as a region of interest (ROI) for a semiconductor device.
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References
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Patent

Low temperature crystallization and pattering of amorphous silicon films

TL;DR: In this paper, a very thin discontinuous film of a nucleating site forming material over the amorphous Si prior to rapid thermal anneal is used to reduce the temperature of polycrystalline Si to a temperature range from 550° C to 650° C.
Patent

Method for manufacturing semiconductor device

TL;DR: In this article, an impurity is injected into a polycrystalline Si film 45, and the impurity ions are diffused to an Si substrate 11 to form diffusion layers 26, 32.
Journal ArticleDOI

In situ transmission electron microscopy studies of silicide‐mediated crystallization of amorphous silicon

TL;DR: In this article, the silicide-mediated phase transformation of amorphous to crystalline silicon was observed in situ in the transmission electron microscope, and a diffusion-controlled mechanism for the enhanced crystallization rate was determined.
Patent

Low temperature crystallization and patterning of amorphous silicon films on electrically insulating substrates

TL;DR: In this paper, a patterning of the deposition of the nucleating site forming material on the glass substrate was proposed to selectively crystallize only in areas in contact with the forming material.
Journal ArticleDOI

Needle-like crystallization of Ni doped amorphous silicon thin films

TL;DR: In this paper, the crystallization behavior of Ni doped co-sputtered amorphous silicon thin films (MSP a-Si(Ni)) is investigated by means of NIR-VIS-UV transmission spectroscopy and STEM.