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Journal ArticleDOI

Straggling of Heavy Charged Particles: Comparison of Born Hydrogenic-Wave-Function Approximation with Free-Electron Approximation

Hans Bichsel
- 01 Apr 1970 - 
- Vol. 1, Iss: 7, pp 2854-2862
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TLDR
In this article, statistical fluctuations in the energy loss of heavy charged particles in this absorbers resulting from collisions with atomic electrons are determined for collision cross sections obtained from the first Born approximation calculated with hydrogenic wave functions.
Abstract
Statistical fluctuations in the energy loss of heavy charged particles in this absorbers resulting from collisions with atomic electrons are determined for collision cross sections obtained from the first Born approximation calculated with hydrogenic wave functions. A comparison is given with the results calculated with a $\frac{1}{{\ensuremath{\epsilon}}^{2}}$ collision spectrum.

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Journal ArticleDOI

Theoretical and experimental aspects of the energy loss of relativistic heavily ionizing particles

TL;DR: In this article, the theory of the electromagnetic interactions between rapidly moving charged particles and the matter through which they pass is reviewed and the stopping power of the projectile and the response of the absorbing medium to the excitation caused by the projectile is considered.
Journal ArticleDOI

A method to improve tracking and particle identification in TPCs and silicon detectors

TL;DR: In this paper, the authors discuss the relevant physics processes involved in PID and tracking and the stochastic nature of the energy loss mechanism, which can be made with analytic and Monte Carlo methods.
Journal ArticleDOI

Excess-path-length distribution of fast charged particles.

TL;DR: In this paper, the Yang equation of the excess-path-length distribution of fast charged particles due to multiple Coulomb scattering under general conditions is completely solved, and the solution is an improvement of the Fermi solution, giving the joint distribution of only the angular and the lateral spreads, to include the excess path length distribution.
Journal ArticleDOI

Energy loss measurement for charged particles in very thin silicon layers

TL;DR: In this article, the dependence of the energy loss distribution from the thickness of the silicon absorber has been investigated in great detail with reference to CMOS Active Pixel Sensors, and the measured energy loss distributions are well-reproduced by calculations also when the target electrons binding energy is taken into account.
Journal ArticleDOI

Large Departures From Landau Distributions for High-energy Particles Traversing Thin Si and Ge Targets

TL;DR: In this paper, the authors measured energy losses of 2 and 8 GeV/c positive and negative electrons, pions and protons transmitted through 32-1040 μm thick germanium and silicon targets using the targets as semiconductor detectors.