XRF analysis: some sensitivity comparisons between charged-particle and photon excitation
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TLDR
In this article, a comparison between the limits of detection for trace elements when charged-particle and photon excited X-ray fluorescence analysis are performed on a specific type of sample (5 mg/cm/sup 2/ organic based).About:
This article is published in Nuclear Instruments and Methods.The article was published on 1977-04-01 and is currently open access. It has received 70 citations till now.read more
Figures
Fig. 2 
TABLE 3 Photon excitation calculated and experimental detection limits (ppm by weight) 
TABLE 2 Measured elemental compositions (see Figs. 4 , 5 and 6) 
Fig. 1. Calculated performance data for 2 MeV proton excitation (20 nC) on a 5 mg/cm sample. The detector solid angle is assumed to be 4w x 0.003 ar. Electron and proton bremsstrahlung are ahovm 
Fig. 7
Citations
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Book ChapterDOI
X-Ray Fluorescence Microprobe for Chemical Analysis
TL;DR: The analytical application of synchrotron radiation is the subject of this chapter and must offer some important advances over present analytical techniques or little justification can be found for the use of a facility remote to most users.
Journal ArticleDOI
Background reduction of x-ray fluorescence spectra in a secondary target energy dispersive spectrometer
P. Standzenieks,E. Selin +1 more
TL;DR: Improved peak-to-background ratios for trace element analysis have been obtained in a conventional spectrometer as discussed by the authors, where the integrated number of background counts is ∼05% of the high energy scattered radiation.
MonographDOI
X-ray Microscopy
TL;DR: In this article, the authors provide a complete introduction to X-ray microscopy, providing all of the technical background required to use, understand, and even develop Xray microscopes.
Journal ArticleDOI
X-ray microanalysis with Si(Li) detectors
TL;DR: In this paper, the Si(Li) detector has brought X-ray microanalysis within the operating current limits of both SEMs and transmission microscopes and has been used for the analysis of thin films, particles and rough surfaces which make use of information contained in the bremsstrahlung continuum.
Journal ArticleDOI
Sensitivity calculations for multielemental trace analysis by synchrotron radiation induced X-ray fluorescence
TL;DR: The application of synchrotron radiation from high energy electron storage rings as an excitation source for X-ray fluorescence analysis of trace elements will greatly extend the sensitivity of the fluorescence technique.
References
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Journal ArticleDOI
X-Ray Fluorescence Yields, Auger, and Coster-Kronig Transition Probabilities
Walter Bambynek,Bernd Crasemann,R.W. Fink,H. U. Freund,Hans Mark,C. D. Swift,R. E. Price,P. Venugopala Rao +7 more
TL;DR: The present status of the field of fluorescence yields, radiationless (Auger and Coster-Kronig) and radiative transition probabilities is summarized in this article, where experimental and theoretical results are included, and tables of best values of important quantities are presented.
Journal ArticleDOI
Inner-Shell Vacancy Production in Ion-Atom Collisions
TL;DR: Theoretical and experimental work relevant to the creation of atomic inner-shell vacancies in collisions of ions and atoms is reviewed in this article, where the experimental data on total excitation cross sections and electron and x-ray emission spectra are discussed in some detail.
Journal ArticleDOI
Proton induced X-ray emission as a tool for trace element analysis
TL;DR: In this paper, the authors studied the production of characteristic X-rays from elements with Z ≳13 using a semiconductor X-ray spectrometer Various competing background processes have been identified, and on this basis, they have calculated lower limits for the sensitivity obtainable for the concentration of the trace element, ranging down to values of 10 −6 −10 −7 .