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Ali Saeidi
Researcher at École Polytechnique Fédérale de Lausanne
Publications - 46
Citations - 564
Ali Saeidi is an academic researcher from École Polytechnique Fédérale de Lausanne. The author has contributed to research in topics: Negative impedance converter & Geology. The author has an hindex of 11, co-authored 25 publications receiving 305 citations. Previous affiliations of Ali Saeidi include University of Tehran & École Polytechnique.
Papers
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Double-Gate Negative-Capacitance MOSFET With PZT Gate-Stack on Ultra Thin Body SOI: An Experimentally Calibrated Simulation Study of Device Performance
TL;DR: In this paper, a double-gate structure was proposed to overcome the large mismatch between the ferroelectric and MOS capacitor to enhance the NC effect and reduce the optimized thickness.
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Negative Capacitance as Performance Booster for Tunnel FETs and MOSFETs: An Experimental Study
Ali Saeidi,Farzan Jazaeri,Francesco Bellando,Igor Stolichnov,G. V. Luong,Qing-Tai Zhao,Siegfried Mantl,Christian Enz,Adrian M. Ionescu +8 more
TL;DR: In this article, a full experimental study of performance boosting of tunnel FETs (TFETs) and MOSFETs by negative capacitance (NC) effect is presented.
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Nanowire Tunnel FET with Simultaneously Reduced Subthermionic Subthreshold Swing and Off-Current due to Negative Capacitance and Voltage Pinning Effects.
Ali Saeidi,Teodor Rosca,Elvedin Memisevic,Igor Stolichnov,Matteo Cavalieri,Lars-Erik Wernersson,Adrian M. Ionescu +6 more
TL;DR: State-of-the-art InAs/InGaAsSb/GaSb nanowire TFETs are employed as the baseline transistor and PZT and silicon-doped HfO2 as ferroelectric materials.
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Modeling and simulation of low power ferroelectric non-volatile memory tunnel field effect transistors using silicon-doped hafnium oxide as gate dielectric
TL;DR: In this paper, the implementation and operation of the nonvolatile ferroelectric memory (NVM) tunnel field effect transistors with silicon-doped HfO2 is proposed and theoretically examined for the first time.
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Effect of hysteretic and non-hysteretic negative capacitance on tunnel FETs DC performance.
Ali Saeidi,Farzan Jazaeri,Igor Stolichnov,G. V. Luong,Qing-Tai Zhao,Siegfried Mantl,Adrian M. Ionescu +6 more
TL;DR: The main beneficial effects of negative capacitance onTFETs are the overdrive and transconductance amplification, which exactly address the most limiting performances of current TFETs.