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Anabela G. Rolo
Researcher at University of Minho
Publications - 87
Citations - 1434
Anabela G. Rolo is an academic researcher from University of Minho. The author has contributed to research in topics: Raman spectroscopy & Thin film. The author has an hindex of 21, co-authored 87 publications receiving 1306 citations.
Papers
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Journal ArticleDOI
Investigation of photoelectrical properties of CdSe nanocrystals embedded in a SiO2 matrix
E. A. Kafadaryan,S. Levichev,S. R. C. Pinto,Natella Aghamalyan,Ruben K. Hovsepyan,G. R. Badalyan,Adil Chahboun,Anabela G. Rolo,M. J. M. Gomes +8 more
TL;DR: In this paper, CdSe nanocrystals (NCs) embedded in SiO2 thin films were prepared using RF-magnetron co-sputtering and the average NC size was estimated to be 18 nm.
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Multilayers of Ge nanocrystals embedded in Al2O3 matrix: Structural and electrical studies
S. R. C. Pinto,Anabela G. Rolo,Adil Chahboun,Maja Buljan,A. Khodorov,Reza J. Kashtiban,Ursel Bangert,N.P. Barradas,Eduardo Alves,Sigrid Bernstorff,M. J. M. Gomes +10 more
TL;DR: In this paper, a multilayer Ge/Al"2O"3 system was grown by pulsed laser ablation and the grown samples were annealed at 900^oC to promote the formation of Ge nanocrystals.
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Estimation of Ge nanocrystals size by Raman, X-rays, and HRTEM techniques
TL;DR: In this paper, a few studies have been reported on Ge NCs embedded in Al2O3 matrix, and they have attracted considerable attention because of their potential applications in nonvolatile memory and integrated optoelectronics.
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FIR optical study of CdS nanocrystals embedded in SiO 2 films
TL;DR: In this article, a dielectric response due to polar optical phonons in CdS-doped SiO 2 films (semiconductor volume fraction f ≈6-15%) was studied experimentally by means of FIR and Raman spectroscopies.
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SiGe layer thickness effect on the structural and optical properties of well-organized SiGe/SiO2 multilayers.
E. M. F. Vieira,Johann Toudert,Anabela G. Rolo,Andrea Parisini,Joaquim P. Leitão,Maria R. Correia,N. Franco,Eduardo Alves,Adil Chahboun,Javier Martín-Sánchez,Rosalía Serna,M. J. M. Gomes +11 more
TL;DR: Spectroscopic ellipsometry was applied to determine the evolution of the onset in the effective optical absorption, as well as the dielectric function, in SiGe multilayers as a function of the SiGe thickness, and a clear blue-shift in the optical absorption is observed.