C
Christoph Quitmann
Researcher at Paul Scherrer Institute
Publications - 51
Citations - 2084
Christoph Quitmann is an academic researcher from Paul Scherrer Institute. The author has contributed to research in topics: Beamline & Swiss Light Source. The author has an hindex of 21, co-authored 51 publications receiving 1885 citations. Previous affiliations of Christoph Quitmann include Lund University.
Papers
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Journal ArticleDOI
Determination of the absolute chirality of adsorbed molecules.
Roman Fasel,J. Wider,J. Wider,Christoph Quitmann,Karl-Heinz Ernst,Karl-Heinz Ernst,Thomas Greber +6 more
TL;DR: It is demonstrated that the absolute configuration of chiral molecules adsorbed on single-crystal surfaces can be determined in a straightforward fashion by means of anglescanned X-ray photoelectron diffraction (XPD), a method delivering direct real-space structural information.
Proceedings ArticleDOI
The PolLux Microspectroscopy Beam line at the Swiss Light Source
TL;DR: In this article, the optical design and performance expectations of a Fresnel zone plate based scanning transmission x-ray microscopy (STXM) beamline at a bending magnet of the Swiss Light Source is described.
Journal ArticleDOI
X-ray photoemission electron microscopy investigation of magnetic thin film antidot arrays
TL;DR: In this article, the authors investigated periodic square arrays of antidots in 10 nm-thick cobalt films with antidot periods, p, ranging from 2 μm down to 200 nm and various ratios of antidot size to antidot separation, w/d.
Journal ArticleDOI
Dynamic vortex-antivortex interaction in a single cross-tie wall.
TL;DR: It is shown that the vortex dynamics can be used to identify the core configuration, which is not directly accessible to x-ray microscopy because of its limited spatial resolution.
Journal ArticleDOI
Uncompensated spins in a micro-patterned CoFeB / MnIr exchange bias system
T. Eimüller,Takeshi Kato,T. Mizuno,Shigeru Tsunashima,Christoph Quitmann,T. Ramsvik,Satoshi Iwata,Gisela Schütz +7 more
TL;DR: In this paper, the element specific domain configuration of a microstructured Co86Fe10B4∕Mn77Ir23∕Ni80Fe20∕Si3N4 exchange bias film was studied by photo-emission electron microscopy using x-ray magnetic circular dichroism.