D
David Schurig
Researcher at University of Utah
Publications - 108
Citations - 24704
David Schurig is an academic researcher from University of Utah. The author has contributed to research in topics: Metamaterial & Lens (optics). The author has an hindex of 33, co-authored 107 publications receiving 22899 citations. Previous affiliations of David Schurig include Duke University & University of California, San Diego.
Papers
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Journal Article
Experimental characterization of magnetic surface plasmons on
Proceedings ArticleDOI
Fabrication and optical measurements of nanoscale meta-materials: terahertz and beyond
Michael C. Martin,Zhao Hao,Alex Liddle,Erik H. Anderson,Willie J. Padilla,David Schurig,David R. Smith +6 more
TL;DR: In this article, the authors report on efforts to create fully left-handed meta-materials at multi-THz frequencies, detailed optical characterizations of various structures fabricated, and understanding to date of what the materials limitations are for making these structures smaller and smaller.
Patent
Evanescent electromagnetic wave conversion apparatus and methods
Jeffrey A. Bowers,Roderick A. Hyde,Edward K. Y. Jung,John B. Pendry,David Schurig,David R. Smith,Clarence T. Tegreene,Thomas A. Weaver,Charles Whitmer,Jr. Lowell L. Wood +9 more
TL;DR: In this article, the authors provide an approach for the conversion of evanescent electromagnetic waves to non-evanescent ones by using an artificially-structured material such as a layered structure or other metamaterial.
Book ChapterDOI
Negative Index Lenses
David Schurig,David R. Smith +1 more
TL;DR: The prelims comprise: Introduction Geometric Optics Gaussian Optics Aberrations References as mentioned in this paper and the references are given in Section 2.2.1] and Section 3.1.
Journal ArticleDOI
Spatial homogeneity of thin films of colossal magnetoresistance materials by scanning ferromagnetic resonance (abstract)
TL;DR: In this article, an effective method for preparing thin films of colossal magnetoresistance (CMR) materials is by pulsed laser deposition (PLD), and the authors have studied such films by measuring the temperature and field dependence of dc resistance, magnetization, and specifically ferromagnetic resonance (FMR).