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Davud V. Guseinov

Researcher at N. I. Lobachevsky State University of Nizhny Novgorod

Publications -  51
Citations -  755

Davud V. Guseinov is an academic researcher from N. I. Lobachevsky State University of Nizhny Novgorod. The author has contributed to research in topics: Electron paramagnetic resonance & Silicon. The author has an hindex of 10, co-authored 48 publications receiving 413 citations. Previous affiliations of Davud V. Guseinov include Saratov State University & Kazan Federal University.

Papers
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Nonstationary distributions and relaxation times in a stochastic model of memristor

TL;DR: Agudov et al. as discussed by the authors proposed a stochastic model for a memristive system by generalizing known approaches and experimental results, and validated their theoretical model by experiments carried out on a Memristive device based on Au/Ta/ZrO2(Y)/Ta2O5/TiN/Ti multilayer structure.
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Field- and irradiation-induced phenomena in memristive nanomaterials

TL;DR: In this article, a comparative analysis of MIM devices based on oxides with dominating ionic (ZrOx, HfOx) and covalent (SiOx, GeOx) bonding of various composition and geometry deposited by magnetron sputtering is presented.
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Stochastic resonance in a metal-oxide memristive device

TL;DR: In this article, the effect of white Gaussian noise superimposed on the sub-threshold sinusoidal driving signal is analyzed through the time series statistics of the resistive switching parameters, the spectral response to a periodic perturbation and the signal-to-noise ratio at the output of the nonlinear system.
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Bipolar resistive switching and charge transport in silicon oxide memristor

TL;DR: In this paper, the authors studied the performance of bipolar resistive switching in SiO x -based thin-film memristor structures deposited by magnetron sputtering technique on the TiN/Ti metalized SiO 2 /Si substrates and established that, after electroforming, the structure can be switched between the quasi-ohmic low-resistance state related to silicon chains (conducting filaments) and the high-resolution state with semiconductor-like hopping mechanism of charge transport through the defects in silicon oxide.