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Etienne Snoeck

Researcher at Centre national de la recherche scientifique

Publications -  246
Citations -  10906

Etienne Snoeck is an academic researcher from Centre national de la recherche scientifique. The author has contributed to research in topics: Magnetization & Electron holography. The author has an hindex of 47, co-authored 242 publications receiving 10005 citations. Previous affiliations of Etienne Snoeck include Paul Sabatier University & Intelligence and National Security Alliance.

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Tunnel magnetoresistance and magnetic ordering in ion-beam sputtered Co80Fe20/Al2O3 discontinuous multilayers

TL;DR: In this article, structural, magnetic, and transport results obtained in a multilayered Co80Fe20(t)/Al2O3(30 A) thin films have been prepared by ion-beam sputtering.
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Magnetotransport properties of Fe3O4 epitaxial thin films: Thickness effects driven by antiphase boundaries

TL;DR: In this paper, the magnetotransport properties of epitaxial Fe3O4 films as a function of film thickness were studied and a model based on spin-polarized transport across an antiferromagnetically coupled APB was proposed.
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Experimental evidence of structural evolution in ultrafine cobalt particles stabilized in different polymers - From a polytetrahedral arrangement to the hexagonal structure

TL;DR: In this paper, the size of the stable monodisperse colloids obtained by reproducibly synthesizing ultrafine cobalt particles by decomposition of an organometallic precursor in the presence of a stabilizing polymer was investigated.
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Electromechanical coupling among edge dislocations, domain walls, and nanodomains in BiFeO3 revealed by unit-cell-wise strain and polarization maps.

TL;DR: This work investigates edge dislocations in ferroelectric BiFeO3 by means of spherical aberration-corrected scanning transmission electron microscopy, a dedicated model-based structure analysis, and phase field simulations, and an atomic model for the dislocation core is derived.
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Folded graphene membranes: mapping curvature at the nanoscale.

TL;DR: A novel method combining apparent strain analysis from high-resolution transmission electron microscopy (HREM) images and theoretical modeling based on continuum elasticity theory and tight-binding atomistic simulations to map and measure the nanoscale curvature of graphene folds and wrinkles is proposed.