G
Gilson Wirth
Researcher at Universidade Federal do Rio Grande do Sul
Publications - 161
Citations - 1992
Gilson Wirth is an academic researcher from Universidade Federal do Rio Grande do Sul. The author has contributed to research in topics: Electronic circuit & Logic gate. The author has an hindex of 22, co-authored 150 publications receiving 1825 citations.
Papers
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Proceedings ArticleDOI
Atomistic approach to variability of bias-temperature instability in circuit simulations
Ben Kaczer,S. Mahato,V. Valduga de Almeida Camargo,Maria Toledano-Luque,Ph. J. Roussel,Tibor Grasser,F. Catthoor,Petr Dobrovolny,P. Zuber,Gilson Wirth,Guido Groeseneken +10 more
TL;DR: In this article, an atomistic approach to introducing time-dependent variability into a circuit simulator in a realistic manner is demonstrated. The approach is based on previously proven physics of stochastic properties of individual gate oxide defects and their impact on FET operation.
Journal ArticleDOI
Using Bulk Built-in Current Sensors to Detect Soft Errors
TL;DR: Connecting a built-in current sensor in the design bulk of a digital system increases sensitivity for detecting transient upsets in combinational and sequential logic.
Journal ArticleDOI
Statistical Model for MOSFET Bias Temperature Instability Component Due to Charge Trapping
TL;DR: In this paper, an analytical model for both stress and recovery phases of bias temperature instability (BTI) is presented, and the model properly describes device behavior under periodic switching, also called AC-BTI or cyclostationary operation.
Journal ArticleDOI
Modeling of statistical low-frequency noise of deep-submicrometer MOSFETs
TL;DR: In this article, the low-frequency noise (LF-noise) of deep-submicrometer MOSFETs is studied with special emphasis on yield relevant parameter scattering.
Proceedings ArticleDOI
Response of a single trap to AC negative Bias Temperature stress
Maria Toledano-Luque,Ben Kaczer,Ph. J. Roussel,Tibor Grasser,Gilson Wirth,Jacopo Franco,Christa Vrancken,Naoto Horiguchi,Guido Groeseneken +8 more
TL;DR: In this paper, the properties of a single gate oxide trap subjected to AC bias temperature instability (BTI) stress conditions were studied by means of Time Dependent Defect Spectroscopy.