K
Kiyeong Kim
Researcher at KAIST
Publications - 31
Citations - 883
Kiyeong Kim is an academic researcher from KAIST. The author has contributed to research in topics: Interposer & Electrical impedance. The author has an hindex of 11, co-authored 31 publications receiving 737 citations. Previous affiliations of Kiyeong Kim include Samsung.
Papers
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Electromagnetic interference shielding effectiveness of monolayer graphene
TL;DR: The modeling work shows that plane-wave theory for metal shielding is also applicable to graphene and suggests the feasibility of manufacturing an ultrathin, transparent, and flexible EMI shield by single or few-layer graphene.
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Modeling and Analysis of Through-Silicon Via (TSV) Noise Coupling and Suppression Using a Guard Ring
Jonghyun Cho,Eakhwan Song,Kihyun Yoon,Jun So Pak,Joohee Kim,Woojin Lee,Taigon Song,Kiyeong Kim,Jun Ho Lee,Hyungdong Lee,Kunwoo Park,Seung-Taek Yang,Min Suk Suh,Kwang-Yoo Byun,Joungho Kim +14 more
TL;DR: In this paper, a TSV noise coupling model is proposed based on a three-dimensional transmission line matrix method (3D-TLM) and a noise isolation technique using a guard ring structure is proposed.
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PDN Impedance Modeling and Analysis of 3D TSV IC by Using Proposed P/G TSV Array Model Based on Separated P/G TSV and Chip-PDN Models
Jun So Pak,Joohee Kim,Jonghyun Cho,Kiyeong Kim,Taigon Song,Seungyoung Ahn,Jun Ho Lee,Hyungdong Lee,Kunwoo Park,Joungho Kim +9 more
TL;DR: In this article, a power/ground (P/G) TSV array model based on separated P/G TSV and chip-PDN models at frequencies up to 20 GHz is proposed for estimating the PDN impedances of 3D TSV ICs.
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Chip-Package Hierarchical Power Distribution Network Modeling and Analysis Based on a Segmentation Method
TL;DR: In this paper, a new modeling method for estimating the impedance properties in a chip-package hierarchical power distribution network (PDN) is proposed, which decomposes the chip package hierarchical PDN into several structures, independently calculate the decomposed structures, and extract the whole structure's impedance by using a segmentation method.
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Measurement and Analysis of a High-Speed TSV Channel
Heegon Kim,Jonghyun Cho,Myunghoi Kim,Kiyeong Kim,Jun Ho Lee,Hyungdong Lee,Kunwoo Park,Kwang-Seong Choi,Hyun-Cheol Bae,Joungho Kim,Jiseong Kim +10 more
TL;DR: In this article, a single-ended high-speed through-silicon via (TSV) channel is measured and analyzed in the frequency-domain and the time-domain, and two types of test vehicles are fabricated, consisting of TSVs and interposers.