L
Le Si Dang
Researcher at University of Grenoble
Publications - 219
Citations - 7814
Le Si Dang is an academic researcher from University of Grenoble. The author has contributed to research in topics: Photoluminescence & Exciton. The author has an hindex of 38, co-authored 216 publications receiving 7282 citations. Previous affiliations of Le Si Dang include Centre national de la recherche scientifique & Joseph Fourier University.
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Journal ArticleDOI
Zeeman spectroscopy of exciton bound to trigonal acceptor center in ZnTe
TL;DR: In this article, the A c 1 line at 2.368 eV in ZnTe was measured in terms of exciton recombination at a neutral acceptor center in a strong trigonal crystal field.
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Piezoelectric fields in CdTe-based heterostructures
Joel Cibert,Régis André,C. Deshayes,Le Si Dang,H. Okumura,Serge Tatarenko,Guy Feuillet,Pierre-Henri Jouneau,R. Mallard,K. Saminadayar +9 more
TL;DR: A detailed study of the simplest structure, a single quantum well coherently grown on a strain-free buffer layer, leads to a better understanding of the role of the built-in field, allows extraction of quantitative data, and underlines some differences between structures incorporating Zn or Mn.
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Optical and morphological properties of GaN quantum dots doped with Tm
T. Andreev,Yuji Hori,X. Biquard,Eva Monroy,D. Jalabert,A. Farchi,Mitsuhiro Tanaka,Osamu Oda,Le Si Dang,Bruno Daudin +9 more
TL;DR: In this paper, the optical and structural properties of wurtzite-phase Tm-doped GaN quantum dots sQDsd embedded in an AlN matrix, grown by plasma-assisted molecular beam epitaxy, were analyzed.
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Spectroscopic study of CdTe layers grown by molecular‐beam epitaxy on (001) and (111) Cd0.96Zn0.04Te substrates
TL;DR: In this article, the optical properties of CdTe epilayers are investigated by means of high-resolution photoluminescence, reflectivity, transmission, and resonant excitation spectroscopy.
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Mismatch strain measurements of MBE grown CdTe
Noel Magnea,F. Dal'bo,C. Fontaine,A. Million,J.P. Gaillard,Le Si Dang,Y.Merle D'Augbigné,Serge Tatarenko +7 more
TL;DR: In this article, X-ray diffraction and free exciton absorption and reflectivity have been used to measure the lattice mismatch induced strain of CdTe layers grown by MBE on (111) and (001) Cd0.96Zn0.04Te substrate.