M
M. Galluppi
Researcher at Infineon Technologies
Publications - 8
Citations - 174
M. Galluppi is an academic researcher from Infineon Technologies. The author has contributed to research in topics: Quantum well & Band gap. The author has an hindex of 5, co-authored 8 publications receiving 172 citations.
Papers
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Journal ArticleDOI
Quantitative description of disorder parameters in (GaIn)(NAs) quantum wells from the temperature-dependent photoluminescence spectroscopy
Oleg Rubel,M. Galluppi,S. D. Baranovskii,Kerstin Volz,Lutz Geelhaar,Henning Riechert,P. Thomas,Wolfgang Stolz +7 more
TL;DR: In this paper, the effect of annealing on the concentration of localized states and/or the localization length of excitons in (GaIn)(NAs) quantum wells is investigated.
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Bound-to-bound and bound-to-free transitions in surface photovoltage spectra: Determination of the band offsets for In x Ga 1 − x As and In x Ga 1 − x As 1 − y N y quantum wells
M. Galluppi,Lutz Geelhaar,Henning Riechert,Michael Hetterich,Andreas Grau,Stefan Birner,Wolfgang Stolz +6 more
TL;DR: In this article, the optical transitions involved in the surface photovoltage (SPV) spectra of type-I quantum well (QW) structures are unambiguously identified.
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Nitrogen and indium dependence of the band offsets in InGaAsN quantum wells
TL;DR: In this article, the authors quantitatively determined the band offsets of single quantum wells with varying nitrogen and indium content by surface photovoltage measurements, and showed the different effect of nitrogen on the valence and on the conduction band states.
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Influence of structural nonuniformity and nonradiative processes on the luminescence efficiency of InGaAsN quantum wells
Lutz Geelhaar,M. Galluppi,G. Jaschke,Robert Averbeck,Henning Riechert,T. Remmele,Martin Albrecht,M. Dworzak,R. Hildebrant,Axel Hoffmann +9 more
TL;DR: In this paper, the luminescence efficiency of InGaAsN quantum wells was analyzed under a variety of conditions, including structural nonuniformity and nonradiative decay time.
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Band offsets analysis of dilute nitride single quantum well structures employing surface photo voltage measurements
TL;DR: The band offsets of InGaAsN single quantum well samples with different indium and nitrogen concentrations have been determined by surface photovoltage measurements as mentioned in this paper, showing that the value of the conduction band offset ratio increases with increasing nitrogen content and decreases with increasing indium concentration.