M
M. Kosec
Researcher at Jožef Stefan Institute
Publications - 79
Citations - 1806
M. Kosec is an academic researcher from Jožef Stefan Institute. The author has contributed to research in topics: Dielectric & Ferroelectricity. The author has an hindex of 21, co-authored 79 publications receiving 1644 citations.
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Journal ArticleDOI
Organic and inorganic relaxor ferroelectrics with giant electrocaloric effect
Sheng-Guo Lu,Brigita Rožič,Qiming Zhang,Zdravko Kutnjak,Xinyu Li,Eugene Furman,Lee J. Gorny,Minren Lin,Barbara Malič,M. Kosec,Robert Blinc,Raša Pirc +11 more
TL;DR: In this article, the electrocaloric effect (ECE) in inorganic thin film and organic relaxor ferroelectrics is investigated by directly measuring the ECE around room temperature, and the results reveal that giant ECEs can be obtained in the high energy electron irradiated poly(vinylidene fluoride-trifluoroethylene) relaxor copolymer and in the La-doped Pb(ZrTi)O3 relaxor ceramic thin films, which are much larger than that from the normal ferroelectric counterparts.
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Electron paramagnetic resonance of magnetoelectric Pb(Fe1∕2Nb1∕2)O3
Robert Blinc,P. Cevc,Andrej Zorko,Janez Holc,M. Kosec,Zvonko Trontelj,Janez Pirnat,Naresh S. Dalal,Vasanth Ramachandran,J. Krzystek +9 more
TL;DR: In this paper, the X-band, Q-band and far infrared electron paramagnetic resonance (EPR) spectra have been measured between 4 and 600K and compared with magnetic susceptibility and magnetization data.
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Relaxorlike dielectric properties and history-dependent effects in the lead-free K0.5Na0.5NbO3–SrTiO3 ceramic system
Vid Bobnar,J. Bernard,M. Kosec +2 more
TL;DR: In this paper, a lead-free K.5Na0.5NbO3-SrTiO3 ceramic system was derived and the dielectric properties were analyzed.
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The application of a milling map in the mechanochemical synthesis of ceramic oxides
TL;DR: In this paper, the use of a milling map in the mechanochemical synthesis of NaNbO3 was evaluated and a comparison between several oxide systems was made based on the experimental data found in the literature.
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Performance and Stability of Low Temperature Transparent Thin-Film Transistors Using Amorphous Multicomponent Dielectrics
Pedro Barquinha,Luís Pereira,Gonçalo Gonçalves,Rodrigo Martins,Danjela Kuscer,M. Kosec,Elvira Fortunato +6 more
TL;DR: In this article, high performance transparent thin-film transistors are presented and analyzed using sputtered multicomponent oxides as dielectric materials based on mixtures of Ta 2 O 5 with SiO 2 or Al 2 O 3.