M
Marion Geidel
Researcher at Dresden University of Technology
Publications - 19
Citations - 362
Marion Geidel is an academic researcher from Dresden University of Technology. The author has contributed to research in topics: Atomic layer deposition & Thin film. The author has an hindex of 9, co-authored 19 publications receiving 289 citations.
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Journal ArticleDOI
Co-sputtering yttrium into hafnium oxide thin films to produce ferroelectric properties
T. Olsen,Uwe Schröder,Stefan Müller,Andreas Krause,Dominik Martin,Aarti Singh,Johannes Müller,Marion Geidel,Thomas Mikolajick +8 more
TL;DR: In this article, thin film capacitors were fabricated by sputtering TiN-Y doped HfO2-TiN stacks on silicon substrates, and the high remanent polarization and relative permittivity were obtained at significantly lower doping concentrations in these sputtered films.
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Enabling Energy Efficiency and Polarity Control in Germanium Nanowire Transistors by Individually Gated Nanojunctions
Jens Trommer,Andre Heinzig,Uwe Mühle,Uwe Mühle,Markus Löffler,Annett Winzer,Paul M. Jordan,Jurgen Beister,Tim Baldauf,Marion Geidel,B. Adolphi,Ehrenfried Zschech,Thomas Mikolajick,Walter M. Weber +13 more
TL;DR: Finite-element drift-diffusion simulations reveal that both leakage current suppression and polarity control can also be achieved at highly scaled geometries, providing solutions for future energy-efficient systems.
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Electrical Evaluation of Ru-W(-N), Ru-Ta(-N) and Ru-Mn films as Cu diffusion barriers
H. Wojcik,R. Kaltofen,U. Merkel,Cornelia Krien,S. Strehle,J. Gluch,Martin Knaut,Christian Wenzel,A. Preusse,Johann W. Bartha,Marion Geidel,B. Adolphi,Volker Neumann,Romy Liske,Frans Munnik +14 more
TL;DR: In this article, a wide range of stoichiometries with regard to crystallization, barrier properties, resistivity, Cu adhesion and direct Cu plating behavior were analyzed with respect to co-sputtered Ru-Ta(N), Ru-W(N) and Ru-Mn composites.
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Barrier performance optimization of atomic layer deposited diffusion barriers for organic light emitting diodes using x-ray reflectivity investigations
Aarti Singh,Hannes Klumbies,Uwe Schröder,Lars Müller-Meskamp,Marion Geidel,Martin Knaut,Christoph Hoßbach,Matthias Albert,Karl Leo,Thomas Mikolajick +9 more
TL;DR: In this article, the importance of O3 pulse duration for encapsulation of organic light emitting diodes (OLEDs) with ultra thin inorganic atomic layer deposited Al2O3 layers is demonstrated for deposition temperatures of 50 °C.
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In-situ analysis on the initial growth of ultra-thin ruthenium films with atomic layer deposition
TL;DR: In this article, the initial growth behavior of ruthenium during the thermal-activated atomic layer deposition (ALD) using [(ethylcyclopentadienyl)(pyrrolyl)ruthensium(II)] (ECPR) and molecular oxygen was investigated in a cluster tool combining an ALD reactor with a surface analysis unit under high vacuum conditions.