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Michel Houssa

Researcher at Katholieke Universiteit Leuven

Publications -  353
Citations -  10857

Michel Houssa is an academic researcher from Katholieke Universiteit Leuven. The author has contributed to research in topics: Gate dielectric & High-κ dielectric. The author has an hindex of 49, co-authored 341 publications receiving 9863 citations. Previous affiliations of Michel Houssa include University of Provence & Centre national de la recherche scientifique.

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Strain-induced semiconductor to metal transition in the two-dimensional honeycomb structure of MoS2

TL;DR: In this article, the electronic properties of two-dimensional honeycomb structures of molybdenum disulfide (MoS2) subjected to biaxial strain have been investigated using first-principles calculations based on density functional theory.
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Buckled two-dimensional Xene sheets

TL;DR: The current state of the art and future opportunities in the manipulation and stability of these materials, their functions and applications, and novel device concepts are highlighted.
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Electronic properties of hydrogenated silicene and germanene

TL;DR: In this paper, the electronic properties of hydrogenated silicene and germanene, so called silicane and Germanane, respectively, are investigated using first-principles calculations based on density functional theory.
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Trap-assisted tunneling in high permittivity gate dielectric stacks

TL;DR: In this article, the electrical characteristics of SiOx/ZrO2 and Si Ox/Ta2O5 gate dielectric stacks were investigated and the current density was shown to be strongly temperature dependent at low voltage (below about 2 V).
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Two-dimensional Si nanosheets with local hexagonal structure on a MoS(2) surface.

TL;DR: The structural and electronic properties of a Si nanosheet grown onto a MoS2 substrate by means of molecular beam epitaxy are assessed and Epitaxially grown Si is shown to adapt to the trigonal prismatic surface lattice ofMoS2 by forming two-dimensional nanodomains.