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Nihar R. Mohapatra

Researcher at Indian Institute of Technology Gandhinagar

Publications -  107
Citations -  899

Nihar R. Mohapatra is an academic researcher from Indian Institute of Technology Gandhinagar. The author has contributed to research in topics: MOSFET & Transistor. The author has an hindex of 11, co-authored 94 publications receiving 715 citations. Previous affiliations of Nihar R. Mohapatra include Indian Institute of Technology Bombay & Indian Institutes of Technology.

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High-performance pipelined central processor for predicting the occurrence of executing single-cycle instructions and multicycle instructions

TL;DR: In this article, a pipelined central processor capable of executing both single-cycle instructions and multicycle instructions is provided, which includes an instruction cache memory and a prediction cache memory that are commonly addressed by a program counter register.
Journal ArticleDOI

Leaky Integrate and Fire Neuron by Charge-Discharge Dynamics in Floating-Body MOSFET.

TL;DR: Overall, conventional PD-SOI-CMOS technology enables very-large-scale-integration (VLSI) which is essential for biology scale (~1011 neuron based) large neural networks.
Journal ArticleDOI

The effect of high-K gate dielectrics on deep submicrometer CMOS device and circuit performance

TL;DR: In this article, the potential impact of high permittivity gate dielectrics on device short channel and circuit performance is studied over a wide range of dielectric permittivities (K/sub gate/) using two-dimensional (2-D) device and Monte Carlo simulations.
Journal ArticleDOI

Modeling of parasitic capacitances in deep submicrometer conventional and high-K dielectric MOS transistors

TL;DR: In this paper, the authors developed circuit models for the parasitic capacitances in conventional and high-K gate dielectric MOS transistors by taking into account the presence of source/drain contact plugs.
Proceedings ArticleDOI

32nm high-density high-speed T-RAM embedded memory technology

TL;DR: Thyristor Random Access Memory embedded in a 32nm logic process with read and write times of 1ns and a bit fail rate less than 0.5ppm is reported for the first time.