P
Peter M. Anderson
Researcher at Ohio State University
Publications - 118
Citations - 4078
Peter M. Anderson is an academic researcher from Ohio State University. The author has contributed to research in topics: Dislocation & Slip (materials science). The author has an hindex of 32, co-authored 117 publications receiving 3445 citations. Previous affiliations of Peter M. Anderson include University of Cambridge & Harvard University.
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Heterostructured materials: superior properties from hetero-zone interaction
Yuntian Zhu,Kei Ameyama,Peter M. Anderson,Irene J. Beyerlein,Huajian Gao,Hyoung Seop Kim,Enrique J. Lavernia,Suveen N. Mathaudhu,Haël Mughrabi,Robert O. Ritchie,Nobuhiro Tsuji,Xiangyi Zhang,Xiaolei Wu +12 more
Abstract: Heterostructured materials are an emerging class of materials with superior performances that are unattainable by their conventional homogeneous counterparts. They consist of heterogeneous zones wi...
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Indentation induced dislocation nucleation: The initial yield point
TL;DR: In this article, a model based upon discretized dislocations is proposed for both the initiation of yielding at an upper yield point and the arrest of the indenter at a lower yield point.
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Hall-Petch relations for multilayered materials
Peter M. Anderson,C. Li +1 more
TL;DR: In this article, the critical resolved shear stress for slip transmission of a pile-up depends on layer thickness, component moduli, interface slip properties, source properties, and pile up orientation.
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Transformation-induced plasticity during pseudoelastic deformation in Ni–Ti microcrystals
D.M. Norfleet,Peter Maxwell Sarosi,Sivom Manchiraju,Martin F.-X. Wagner,Michael D. Uchic,Peter M. Anderson,Michael J. Mills +6 more
TL;DR: In this paper, post-mortem scanning transmission electron microscopy reveals no apparent retained martensite but rather a macroscopic band of dislocation activity within which are planar arrays of ∼100nm dislocation loops involving a single slip system.
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Dislocation-Based Deformation Mechanisms in Metallic Nanolaminates
TL;DR: In this paper, a semi-quantitative model of yield strength was developed, which requires, as input, the strength of an interface to crystal slip transmission across it, and applied the theory to demonstrate a peak in strength for a 50 vol% Cu-50 vol% Ni multilayered sample.