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Richard Celestre

Researcher at Lawrence Berkeley National Laboratory

Publications -  53
Citations -  2924

Richard Celestre is an academic researcher from Lawrence Berkeley National Laboratory. The author has contributed to research in topics: Beamline & Diffraction. The author has an hindex of 24, co-authored 52 publications receiving 2683 citations. Previous affiliations of Richard Celestre include Stanford University.

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Beamline 10.3.2 at ALS: a hard X-ray microprobe for environmental and materials sciences.

TL;DR: Beamline 10.3.2 at the ALS is a bend-magnet line designed mostly for work on environmental problems involving heavy-metal speciation and location, which offers a unique combination of X-ray fluorescence mapping, X-Ray microspectroscopy and micro-X-ray diffraction.
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Scanning X-ray microdiffraction with submicrometer white beam for strain/stress and orientation mapping in thin films.

TL;DR: Scanning X-ray microdiffraction (microSXRD) combines the use of high-brilliance synchrotron sources with the latest achromaticX-ray focusing optics and fast large-area two-dimensional-detector technology to study thin aluminium and copper blanket films and lines following electromigration testing and/or thermal cycling experiments.
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Molecular-scale speciation of Zn and Ni in soil ferromanganese nodules from loess soils of the Mississippi Basin.

TL;DR: The speciation of Zn and Ni in ferromanganese nodules from loess soils of the Mississippi Basin was determined by a synergistic use of three noninvasive synchrotron-based techniques, providing a new method for determining trace metal speciation in both natural and contaminated environmental materials.
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Submicron X-ray diffraction and its applications to problems in materials and environmental science.

TL;DR: The availability of high brilliance third generation synchrotron sources together with progress in achromatic focusing optics allows us to add submicron spatial resolution to the conventional century-old x-ray diffraction technique as discussed by the authors.
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Tin whiskers studied by synchrotron radiation scanning X-ray micro-diffraction

TL;DR: A large number of Sn whiskers have been found on the Pb-free solder finish on leadframes used in consumer electronic products as mentioned in this paper, and the growth direction of whiskers is known to be a stress relief phenomenon.