Roberto Dinapoli

TL;DR: Characterization of PILATUS single-photon-counting X-ray detector modules regarding charge sharing, energy resolution and rate capability is presented and the performance of the detector was tested with surface diffraction experiments at the synchrotron.

TL;DR: It is demonstrated that X-ray ptychography—a high-resolution coherent diffractive imaging technique—can create three-dimensional images of integrated circuits of known and unknown designs with a lateral resolution in all directions down to 14.6 nanometres.

TL;DR: The SwissFEL X-ray Free Electron Laser (XFEL) facility as discussed by the authors started construction at the Paul Scherrer Institute (Villigen, Switzerland) in 2013 and will be ready to accept its first users in 2018 on the Aramis hard Xray branch.

TL;DR: The PILATUS hybrid pixel detector as discussed by the authors combines silicon sensors with CMOS processing chips by a 2D micro bump-bonding interconnection technology developed at the Paul Scherrer Institute.

TL;DR: The DRS4 chip contains several improvements such as an on-chip PLL for sampling-frequency stabilization and various mechanisms to reduce the read out dead-time, making this chip attractive for many experiments, replacing traditional ADCs and TDCs.