S
S. Ely
Researcher at University of California, Santa Cruz
Publications - 4
Citations - 85
S. Ely is an academic researcher from University of California, Santa Cruz. The author has contributed to research in topics: Wafer dicing & Voltage. The author has an hindex of 4, co-authored 4 publications receiving 80 citations.
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Journal ArticleDOI
Development of n + -in-p large-area silicon microstrip sensors for very high radiation environments - ATLAS12 design and initial results
Yoshinobu Unno,S. Edwards,S. Pyatt,J. P. Thomas,J. A. Wilson,J.A. Kierstead,David Lynn,J. R. Carter,L. B. A. H. Hommels,David Robinson,Ingo Bloch,I. M. Gregor,Kerstin Tackmann,Christopher Betancourt,Karl Jakobs,Susanne Kuehn,R. Mori,Ulrich Parzefall,L. Wiik-Fucks,A. G. Clark,Didier Ferrere,S. Gonzalez Sevilla,J. Ashby,Andrew Blue,Richard Bates,C. Buttar,F. Doherty,Lars Eklund,T. McMullen,F. McEwan,V. O׳Shea,S. Kamada,Kazuhisa Yamamura,Yoichi Ikegami,Koji Nakamura,Yosuke Takubo,R. Nishimura,Ryuichi Takashima,A. Chilingarov,Harald Fox,A. A. Affolder,P. P. Allport,Gianluigi Casse,Paul Dervan,D. Forshaw,A. Greenall,S. Wonsak,M. Wormald,Vladimir Cindro,Gregor Kramberger,Igor Mandić,Marko Mikuz,I. V. Gorelov,Martin Hoeferkamp,Prabhakar Palni,Sally Seidel,A. C. Taylor,Konstantin Toms,Rui Wang,Nigel Hessey,Nika Valencic,Y. Arai,Kazunori Hanagaki,Zdenek Dolezal,Peter Kodys,J. Bohm,Marcela Mikestikova,Adrian John Bevan,G. A. Beck,S. Ely,Vitaliy Fadeyev,Z. Galloway,Alexander Grillo,F. Martinez-McKinney,J. Ngo,C. Parker,H. F.W. Sadrozinski,D. Schumacher,A. Seiden,Richard French,Paul Hodgson,Hector Marin-Reyes,Kerry Ann Parker,S. Paganis,Osamu Jinnouchi,Kazuki Motohashi,Kazuki Todome,Dean T. Yamaguchi,Kazuhiko Hara,Mutsuto Hagihara,Carmen García,J. Jimenez,Carlos Lacasta,S. Marti i Garcia,U. Soldevila +94 more
TL;DR: In this paper, the authors have developed a novel radiation-tolerant n+in-p silicon microstrip sensor for very high radiation environments, aiming for application in the high luminosity large hadron collider.
Journal ArticleDOI
Characterisation of edgeless technologies for pixellated and strip silicon detectors with a micro-focused X-ray beam
Richard Bates,Andrew Blue,Marc Christophersen,Lars Eklund,S. Ely,Vitaliy Fadeyev,E.N. Gimenez,V Kachkanov,Juha Kalliopuska,Anna Macchiolo,Dzmitry Maneuski,Bernard F. Phlips,Hartmut Sadrozinski,Graeme Stewart,Nicola Tartoni,Rasif Mohd. Zain +15 more
TL;DR: In this article, two edgeless detectors were characterized at the Diamond Light Source using an 11mm FWHM 15 keV micro-focused X-ray beam and showed no drop in charge collection recorded between the centre and edge pixels.
Journal ArticleDOI
Charge collection measurements on slim-edge microstrip detectors
R Mori,Mara Bruzzi,M Cartiglia,Marc Christophersen,S. Ely,F. Martinez-McKinney,Bernard F. Phlips,Hartmut Sadrozinski,Vitaliy Fadeyev +8 more
TL;DR: In this paper, the authors have generated slim edges on manufactured silicon strip detectors by cleaving the nonactive edge material and passivating the very smooth edge with a thin coat of silicon oxide.
Journal ArticleDOI
The Punch-Through Effect in Silicon Strip Detectors
C. Betancourt,A. Bielecki,Z. Butko,A. Deran,S. Ely,Vitaliy Fadeyev,C. Parker,N. Ptak,H. F.W. Sadrozinski,J. Wright +9 more
TL;DR: In this article, the authors showed that the PTP structures are only effective at very large currents (several mA), and clamp the strips to much larger voltage than the one derived from DC scans.