scispace - formally typeset
S

Shiwei Feng

Researcher at Beijing University of Technology

Publications -  122
Citations -  630

Shiwei Feng is an academic researcher from Beijing University of Technology. The author has contributed to research in topics: Thermal resistance & Temperature measurement. The author has an hindex of 11, co-authored 98 publications receiving 428 citations.

Papers
More filters
Journal ArticleDOI

Effect of Self-Heating on the Drain Current Transient Response in AlGaN/GaN HEMTs

TL;DR: In this article, the self-heating effect on the drain current transient response in AlGaN/GaN high electron mobility transistors (HEMTs) was investigated experimentally.
Journal ArticleDOI

Junction Temperature Measurement Method for Power mosfets Using Turn-On Delay of Impulse Signal

TL;DR: In this article, a novel junction temperature measurement method for power metal-oxide-semiconductor field effect transistors ( mosfet s) is proposed, which is based on the turn-on delay of impulse signal.
Journal ArticleDOI

A New Differential Amplitude Spectrum for Analyzing the Trapping Effect in GaN HEMTs Based on the Drain Current Transient

TL;DR: In this paper, a differential amplitude spectrum (DAS) from which the exact amount that a trap contributes to charging/discharging from the current transient is extracted theoretically and experimentally.
Journal ArticleDOI

The thermal properties of AlGaAs/GaAs laser diode bars analyzed by the transient thermal technique

TL;DR: In this paper, the thermal properties of AlGaAs/GaAs laser diode bars have been analyzed in detail by transient thermal technique based on the diode forward voltage method on the vertical and horizontal thermal conduction paths, respectively.
Journal ArticleDOI

Two-dimensional transient simulations of the self-heating effects in GaN-based HEMTs

TL;DR: The results show that the peak temperature in pulse mode with the same operating frequency increases with the duty cycle under quasi-steady-state, but the changing rate decreases as the temperature goes up, which can be used to improve the lifetime and performance reliability.