S
Sunhee Lee
Researcher at Purdue University
Publications - 44
Citations - 1721
Sunhee Lee is an academic researcher from Purdue University. The author has contributed to research in topics: Engineering & Electronic structure. The author has an hindex of 12, co-authored 37 publications receiving 1537 citations.
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Journal ArticleDOI
A single-atom transistor
Martin Fuechsle,Jill A. Miwa,Suddhasatta Mahapatra,Hoon Ryu,Sunhee Lee,Oliver Warschkow,Lloyd C. L. Hollenberg,Gerhard Klimeck,Michelle Y. Simmons +8 more
TL;DR: This work presents atomic-scale images and electronic characteristics of these atomically precise devices and the impact of strong vertical and lateral confinement on electron transport and discusses the opportunities ahead for atomic- scale quantum computing architectures.
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Ohm's Law Survives to the Atomic Scale
Bent Weber,Suddhasatta Mahapatra,Hoon Ryu,Sunhee Lee,Andreas Fuhrer,Thilo Reusch,D.L. Thompson,W. C. T. Lee,Gerhard Klimeck,Lloyd C. L. Hollenberg,Michelle Y. Simmons +10 more
TL;DR: By embedding phosphorus atoms within a silicon crystal with an average spacing of less than 1 nanometer, this work achieved a diameter-independent resistivity, which demonstrates ohmic scaling to the atomic limit.
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Atomistic Simulation of Realistically Sized Nanodevices Using NEMO 3-D—Part I: Models and Benchmarks
Gerhard Klimeck,Shaikh Ahmed,H. Bae,Neerav Kharche,Steven Clark,Benjamin P Haley,Sunhee Lee,Maxim Naumov,Hoon Ryu,Faisal Saied,Marta Prada,Marek Korkusinski,Timothy B. Boykin,Rajib Rahman +13 more
TL;DR: The 3-D nanoelectronic MOdeling (NEMO 3D) tool has been developed to address the needs of device physics and material science at the atomic scale of novel nanostructured semiconductors as mentioned in this paper.
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Computational Study on the Performance of Si Nanowire pMOSFETs Based on the $k \cdot p$ Method
TL;DR: In this article, full-quantum device simulations on p-type Si nanowire field effect transistors based on the k · p method, using the k·p parameters tuned against the sp3s* tight-binding method, are carried out.
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Electronic structure of realistically extended atomistically resolved disordered Si:P δ-doped layers
Sunhee Lee,Hoon Ryu,Hoon Ryu,Huw Campbell,Lloyd C. L. Hollenberg,Michelle Y. Simmons,Gerhard Klimeck +6 more
TL;DR: In this paper, highly confined Si:P-doped layers are studied to explain the disorder in the dopant placements in realistically extended systems. But the authors do not consider the effects of experimentally unavoidable randomness through explicitly disordered dopant placement.