T
Tae Won Noh
Researcher at Seoul National University
Publications - 295
Citations - 12804
Tae Won Noh is an academic researcher from Seoul National University. The author has contributed to research in topics: Thin film & Ferroelectricity. The author has an hindex of 49, co-authored 268 publications receiving 11057 citations. Previous affiliations of Tae Won Noh include Cornell University & Ohio State University.
Papers
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Oxygen vacancy-induced topological nanodomains in ultrathin ferroelectric films
TL;DR: In this paper, it was shown that in a high-quality, uniaxial ferroelectric system, i.e., compressively strained BaTiO3 ultrathin films (below 10nm), nanoscale polarization structures can be created by intentionally introducing oxygen vacancies in the film while maintaining structure integrity (namely no extended lattice defects).
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Double-layer buffer template to grow commensurate epitaxial BaBiO3 thin films
Han Gyeol Lee,Yoonkoo Kim,Sang Woon Hwang,Gideok Kim,Tae Dong Kang,Minu Kim,Miyoung Kim,Tae Won Noh +7 more
TL;DR: In this article, a BaCeO3/BaZrO3 double-layer buffer template was proposed for epitaxial growth of a target oxide film with large lattice constants of over 4.1 A.
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Asymmetric switching and imprint in (La,Sr)CoO3/Pb(Zr,Ti)O3/(La,Sr)CoO3 heterostructures
TL;DR: In this article, the Pb(Zr,Ti)O3 (PZT) thin films with different electrode configuration were grown on LaAlO3 substrates by pulsed laser deposition (PLD).
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The energy band alignment at the interface between mechanically exfoliated few-layer NiPS3 nanosheets and ZnO
Cheng-Tai Kuo,K. Balamurugan,Hung-Wei Shiu,Hyun Ju Park,Soobin Sinn,Michael Neumann,Moonsup Han,Young Jun Chang,Chia-Hao Chen,Hyeong-Do Kim,Je-Geun Park,Tae Won Noh +11 more
TL;DR: In this paper, the electronic structure and interfacial properties of mechanically exfoliated few-layer NiPS 3 van der Waals crystals on ZnO/Nb:SrTiO 3 substrates were studied using scanning photoelectron microscopy and spectroscopy.
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Far-infrared investigation of the generalized Lyddane-Sachs-Teller relation using ZnS-diamond composites
TL;DR: Calculated de la fonction dielectrique des echantillons avec des fractions f de remplissage volumique du diamant allant jusqu'a 55%.