T
Tae Won Noh
Researcher at Seoul National University
Publications - 295
Citations - 12804
Tae Won Noh is an academic researcher from Seoul National University. The author has contributed to research in topics: Thin film & Ferroelectricity. The author has an hindex of 49, co-authored 268 publications receiving 11057 citations. Previous affiliations of Tae Won Noh include Cornell University & Ohio State University.
Papers
More filters
Journal ArticleDOI
Polarization Relaxation Induced by a Depolarization Field in Ultrathin Ferroelectric BaTiO 3 Capacitors
Dong Jik Kim,Ji Young Jo,Yong Su Kim,Young Jun Chang,J. S. H. Lee,Jong-Gul Yoon,Tae Kwon Song,Tae Won Noh +7 more
TL;DR: In this paper, the time-dependent polarization relaxation behavior induced by a depolarization field E(d) was investigated on high-quality ultrathin BaTiO3/SrRuO3 capacitors.
Journal ArticleDOI
Enhanced tunnelling electroresistance effect due to a ferroelectrically induced phase transition at a magnetic complex oxide interface
Yuewei Yin,Yuewei Yin,John D. Burton,Y-M. Kim,Albina Y. Borisevich,S. J. Pennycook,Sang Mo Yang,Tae Won Noh,Alexei Gruverman,Xiaoguang Li,Evgeny Y. Tsymbal,Qi Li +11 more
TL;DR: Electrical, ferroelectric and magnetoresistive measurements combined with first-principles calculations provide evidence for a magnetoelectric origin of the enhanced TER, and indicate the presence of defect-mediated conduction in the FTJs.
Journal Article
Giant Flexoelectric Effect in Ferroelectric Epitaxial Thin Films
TL;DR: In this paper, a combination of transmission electron microscopy, electrical measurements, and electrostatic calculations showed that flexoelectricity provides a means of tuning the physical properties of ferroelectric epitaxial thin films.
Journal ArticleDOI
Polarity control of carrier injection at ferroelectric/metal interfaces for electrically switchable diode and photovoltaic effects
TL;DR: In this article, the authors investigated a switchable ferroelectric diode effect and its physical mechanism in Pt/BiFeO{}_{3}$/SrRuO${}{3}µ thin-film capacitors and showed that a defective layer (possibly an oxygen-vacancyrich layer) becomes formed and disturbs carrier injection.
Journal ArticleDOI
Experimental study of the three-dimensional ac conductivity and dielectric constant of a conductor-insulator composite near the percolation threshold.
TL;DR: The ac conductivity and dielectric constant of a three-dimensional randomly mixed conductor-insulator system consisting of amorphous carbon and Teflon powder in the frequency range from 10 Hz to 13 MHz is measured.