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V. M. Gehman

Researcher at Lawrence Berkeley National Laboratory

Publications -  115
Citations -  9745

V. M. Gehman is an academic researcher from Lawrence Berkeley National Laboratory. The author has contributed to research in topics: Double beta decay & Xenon. The author has an hindex of 38, co-authored 112 publications receiving 8810 citations. Previous affiliations of V. M. Gehman include Virginia Tech & Los Alamos National Laboratory.

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Accurate γ and MeV-electron track reconstruction with an ultra-low diffusion Xenon/TMA TPC at 10 atm

TL;DR: In this paper, the performance of a 10-atm Xenon/trimethylamine time projection chamber (TPC) for the detection of X-rays and γ-rays was reported.
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NEXT-100 Technical Design Report (TDR). Executive Summary

TL;DR: The Next-100 detector as mentioned in this paper was designed to search for neutrinoless double beta decay (bbonu) in Xe-136 at the Laboratorio Subterraneo de Canfranc (LSC) in Spain.
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Characteristics of Signals Originating Near the Lithium-Diffused N+ Contact of High Purity Germanium P-Type Point Contact Detectors

E. Aguayo, +84 more
TL;DR: In this article, the transition region between the active germanium and the fully dead layer of the n+ contact was examined and the energy depositions in this transition region were shown to result in partial charge collection.
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Radiopurity control in the NEXT-100 double beta decay experiment: procedures and initial measurements

Víctor H. Alvarez, +94 more
TL;DR: In this paper, the Next Collaboration acknowledges funding support from the following agencies and institutions: the Spanish Ministerio de Economia y Competitividad under grants CONSOLIDER-Ingenio 2010 CSD2008-0037 (CUP), Consolider-Ingensio 2010CSD2007-00042 (CPAN), and under contracts ref. DE-AC02-05CH11231.
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Measurements of the intrinsic quantum efficiency and absorption length of tetraphenyl butadiene thin films in the vacuum ultraviolet regime

TL;DR: In this article, the authors present the first measurements of the room-temperature microphysical quantum efficiency for vacuum-deposited tetraphenyl butadiene (TPB) thin films.