V
Vasili Perebeinos
Researcher at State University of New York System
Publications - 151
Citations - 14700
Vasili Perebeinos is an academic researcher from State University of New York System. The author has contributed to research in topics: Graphene & Carbon nanotube. The author has an hindex of 52, co-authored 139 publications receiving 13771 citations. Previous affiliations of Vasili Perebeinos include Purdue University & Skolkovo Institute of Science and Technology.
Papers
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Carbon-based electronics.
TL;DR: This work reviews the progress that has been made with carbon nanotubes and, more recently, graphene layers and nanoribbons and suggests that it could be possible to make both electronic and optoelectronic devices from the same material.
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Carbon-nanotube photonics and optoelectronics
TL;DR: In this article, the fundamental optical behavior of carbon nanotubes as well as their opportunities for light generation and detection, and photovoltaic energy generation are described. But the authors do not discuss the potential of using these materials for light and energy generation.
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The origins and limits of metal–graphene junction resistance
TL;DR: It is reported that the contact resistance in a palladium-graphene junction exhibits an anomalous temperature dependence, dropping significantly as temperature decreases to a value of just 110 ± 20 Ω µm at 6 K, which is two to three times the minimum achievable resistance.
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Scaling of excitons in carbon nanotubes.
TL;DR: It is found that simple scaling relationships give a good description of the binding energy, exciton size, and oscillator strength of excitons in nanotubes embedded in a dielectric.
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Photocurrent imaging and efficient photon detection in a graphene transistor
Fengnian Xia,Thomas Mueller,Roksana Golizadeh-Mojarad,Marcus Freitag,Yu-Ming Lin,James C. Tsang,Vasili Perebeinos,Phaedon Avouris +7 more
TL;DR: It is shown that at a certain gate bias, the impact of the metal on the channel potential profile extends into the channel for more than one-third of the total channel length from both source and drain sides; hence, most of the channel is affected by the metal.