V
Vinayak Bharat Naik
Researcher at GlobalFoundries
Publications - 74
Citations - 1012
Vinayak Bharat Naik is an academic researcher from GlobalFoundries. The author has contributed to research in topics: Tunnel magnetoresistance & Layer (electronics). The author has an hindex of 17, co-authored 68 publications receiving 863 citations. Previous affiliations of Vinayak Bharat Naik include Nanyang Technological University & National University of Singapore.
Papers
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Journal ArticleDOI
Magnetic and magnetoelectric studies in pure and cation doped BiFeO3
TL;DR: In this article, the effect of divalent cation substitution on magnetic and magnetoelectric properties in Bi1−xAxFeO3 (A=Sr, Ba and Sr0.5Ba0.3) was investigated.
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Thick CoFeB with perpendicular magnetic anisotropy in CoFeB-MgO based magnetic tunnel junction
TL;DR: In this article, the effect of an ultra-thin Ta insertion in the CoFeB free layer (FL) on magnetic and tunneling magnetoresistance (TMR) properties was investigated.
Journal ArticleDOI
Electric field effects in low resistance CoFeB-MgO magnetic tunnel junctions with perpendicular anisotropy
TL;DR: In this article, the authors investigated the electric field effects in low-resistance perpendicular magnetic tunnel junction (MTJ) devices and found that electric field can effectively reduce the coercivity (Hc) of free layer (FL) by 30% for a bias voltage Vb = 0.2
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Large reversible magnetocaloric effect in La0.7-xPrxCa0.3MnO3
TL;DR: In this paper, the magnetocaloric effect in polycrystalline La0.7−xPrxCa0.35 compound was investigated using a differential scanning calorimeter working in a magnetic field environment.
Proceedings ArticleDOI
Manufacturable 22nm FD-SOI Embedded MRAM Technology for Industrial-grade MCU and IOT Applications
Vinayak Bharat Naik,J. H. Lim,Tae Young Lee,W. P. Neo,Hemant Dixit,L. C. Goh,T. Ling,J. Hwang,D. Zeng,J. W. Ting,Kangho Lee,Eng Huat Toh,L. Zhang,R. Low,N. Balasankaran,L. Y. Zhang,K. W. Gan,L. Y. Hau,Johannes Mueller,B. Pfefferling,O. Kallensee,K. Yamane,S. L Tan,Chim Seng Seet,Y. S. You,S. T. Woo,E. Quek,S. Y. Siah,John Pellerin,R. Chao,J. Kwon,Naganivetha Thiyagarajah,N. L. Chung,S. H. Jang,Behtash Behin-Aein +34 more
TL;DR: In this paper, a manufacturable 22nm FD-SOI 40Mb embedded MRAM (eMRAM) was demonstrated to achieve product functionality and reliability at package level across industrial-grade operating temperature range (−40 to 125 °C) with ECC-off mode.