Showing papers in "Microelectronics Reliability in 1978"

TL;DR: Test cases can be designed so that their associated subsets cover the entire input domain, allowing reliability estimatesto be made for expected operational use profiles.

TL;DR: A survey of the key statistical properties of the lognormal distribution which are relevant in device engineering can be found in this article, where the confidence limits on the median life and standard deviation of the population as a function of confidence level and sample size are given in novel graphical forms.

TL;DR: In this article, a multiobjective reliability and redundancy allocation problem of a series-parallel system through the application of the Surrogate Worth Trade-off method is considered.

TL;DR: In this paper, a mathematical relation has been developed to explain the variation of thermal conductivity of silicon from room temperature to its melting point quite accurately, and the theoretical results obtained for various temperatures have been compared with the experimental results.

TL;DR: Software system development is viewed as a series of discrete ordered activities that produce successively more constrained models of the system by binding in additional system aspects by treating the system aspects as separate concerns.

TL;DR: In this paper, a repairable k-out-of-n three-state device network model with common-cause failures is presented, where Laplace transforms of the state probability equations are developed.

TL;DR: This paper presents a brief introduction and an extensive list of selective references on fault trees, as well as a summary of existing literature and new discoveries about fault trees and their applications.

TL;DR: In this article, a two non-identical active redundant units system model is presented to include common cause failures, and the steady state probability and system availability equations are developed, where the common cause failure is defined as a single point failure.

TL;DR: In this article, the authors considered an N-unit parallel redundant system with correlated failure and single repair facility, where correlation means that any two units in the system or all the units are possible to fail at the same time.

TL;DR: It is shown that under certain conditions there exists a finite and unique optimum policy maximizing the cost effectiveness of an inspection-ordering policy for a single-unit system with two kind of lead times.

TL;DR: In this paper, failure rates and failure modes of biased and stored plastic encapsulated devices are detailed, and preliminary CMOS reliability information is also presented, indicating that certain plastic packaged microcircuits have performed as well as hermetic ceramic units.

TL;DR: The second part of this paper deals with ways of using a minimalized lattice polynomial to derive a numerical-valued probability function from which to calculate the system reliability: also computer software, error bounds and approximations.

TL;DR: In this article, a system with two mutually exclusive failure modes and N stand-by units is presented, where the repair is considered at one failure mode. And the state probability equations are developed in Laplace transform.

TL;DR: In this article, a method for optimizing reliability by use of redundancy in systems which may be complex or series, is described, where redundant units are allocated to various subsystems of the system in direct proportion to the normalized partial derivative of the reliability with respect to component reliability of the subsystem.

TL;DR: In this paper, two operational research approaches to solving maintenance problems are presented, namely, the determination of optimal interval between overhauls of key production equipment and second determination of the optimal inspection frequency for the same equipment.

TL;DR: If repairs are assumed to occur instantaneously, whilst unrevealed faults occur at random, then it is found that the reliability of the system is independent of the distribution of the time to a revealed fault following a repair.

TL;DR: In this article, the Laplace transform of the availability of a two unit standby redundant system with imperfect switchover is obtained by identifying suitable regeneration points, and the steady state behaviour is also discussed.

TL;DR: In this article, the stochastic behaviour of a 2-unit cold-standby intermittently used system and derives the Laplace-Stieltjes Transform of 1. (i) the distribution of first disappointment time; 2. (ii) probability that the system is under disappointment at time t ; 3.

TL;DR: In this article, the effect of availability and life cycle costs by equipment reliability, maintainability, system configuration and technician response time to equipment failures is shown, and guidelines are given to assist the project manager in determining best system parameters for minimizing life cycle cost for a particular application.

TL;DR: In this article, the availability and reliability analysis of a single-server two-unit hot standby system subject to preventive maintenance and repair is presented. But the analysis is carried out by identifying suitable imbedded regenerative stochastic processes.

TL;DR: In this article, the authors deal with the noise analysis of Indian manufactured samples of transistors, zeners and linear integrated circuits and propose a screening technique that is applicable to all semiconductor devices.

TL;DR: In this paper, the problem of reliability optimization in redundant systems with two classes of failure modes has been solved using various mathematical programming techniques which are quite involved and slow, and the solution to this problem has been presented using normalized partial derivatives of the system reliability with respect to component reliabilities in each class of failure mode of the subsystems.

TL;DR: In this article, the authors present a method of reliability analysis for CANDU nuclear power plant control systems using various reliability techniques and engineering judgement, which includes system study, field data, failure mode and effect analysis, common mode failures, fault trees, human factors, reliability targets, and design reviews.

TL;DR: A modified model is presented to show a close relationship in failure rates of small gate count LSI devices and to modify the results of higher gate countLSI devices using MIL-HDBK-217B data.

TL;DR: In this article, the reliability of CMOS I.C.'s is discussed and design and manufacturing considerations which are used to build reliability into the product are discussed, and the accelerated life testing is used to evaluate the product in epoxy packages.

TL;DR: A new technique for solution of reliability optimization problem in modular redundant systems whose sybsystems may be in series or complex configuration and are subject to multiple linear and/or nonlinear constraints is proposed.

TL;DR: In this paper, the authors describe the experience of Bell-Northern Research and Northern Telecom Ltd. with MOS dynamic RAMS in high reliability switching systems and the resulting device drop-out rates in manufacturing and the effect of this comprehensive pre-conditioning on the field failure rate of MOS memory cards are discussed.

TL;DR: In this paper, a metal-oxide-semiconductor capacitance structure in which the metal is a nichrome resistor is specified, and two methods of varying the oscillation frequency are considered.

TL;DR: In this article, the authors present an idea about three new hazard rate functions, namely, hazard rate, reliability, and hazard rate and reliability expressions, which are derived from the hazard rate function and reliability function.

TL;DR: A general review of status and progress that has been made in Reliability Testing and Screening is given in this paper, where both the old and the new techniques developed for modern management support are included.