Proceedings ArticleDOI
Automated in-situ optimization of bimorph mirrors at Diamond Light Source
TLDR
In this article, a pencil beam measurement is used to determine a Bimorph active mirror's slope errors and these data are then used by automated scripts to calculate the necessary corrections.Abstract:
Bimorph mirrors are used on many synchrotron beamlines to focus or collimate light. They are highly adaptable because
not only their overall figure but also their local slope errors can be corrected. However, the optimization procedure is
complex. At Diamond Light Source, highly repeatable and accurate pencil beam measurements are used to determine a
mirror's slope errors. These data are then used by automated scripts to calculate the necessary corrections. This procedure
may be applied to any type of active mirror, but for hard X-ray mirrors, diffraction from the slits must be considered.read more
Citations
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Journal ArticleDOI
Cloud computing in e-Science: research challenges and opportunities
Xiaoyu Yang,David Wallom,Simon N. Waddington,Jianwu Wang,Arif Shaon,Brian Matthews,Michael D. Wilson,Yike Guo,Li Guo,Jon Blower,Athanasios V. Vasilakos,Kecheng Liu,Philip Kershaw +12 more
TL;DR: This survey paper describes recent research advances in applying informatics techniques to facilitate scientific research particularly from the Cloud computing perspective and identifies associated research challenges and opportunities.
Journal ArticleDOI
In situ beamline analysis and correction of active optics
TL;DR: In this article, an automated procedure has been implemented to calculate the actuator settings that optimize its figure for an active mirror, and application of the optimization procedure to another mechanically bent mirror led to an improvement of its sag compensation mechanism.
Journal ArticleDOI
Bimorph mirrors: The Good, the Bad, and the Ugly
Simon G. Alcock,John P. Sutter,Kawal Sawhney,David R. Hall,Katherine McAuley,Thomas Sorensen +5 more
TL;DR: In this paper, three pairs of bimorph mirrors were re-polished at Thales-SESO to remove the junction effect and significantly improved beamline performance, and the results showed that the internal structure of the mirrors will retain their surface quality, and remain operational for many years.
Journal ArticleDOI
Characterisation of a novel super-polished bimorph mirror
Kawal Sawhney,Simon G. Alcock,John P. Sutter,Sebastien Berujon,Hongchang Wang,Riccardo Signorato +5 more
TL;DR: In this article, a super-polished adaptive bimorph mirror has been developed, which provides variable focal distance and local figure control in the sub-nm range, and has the potential to generate distortion-free beams and enable dynamical focusing and wavefront control.
Journal ArticleDOI
Current status of the NSLS-II optical metrology laboratory
TL;DR: The NSLS-II Optical Metrology Laboratory (NSLSII-OML) as discussed by the authors includes commercial instruments for measuring long spatial frequency figure errors, mid spatial frequencies and high frequency roughness and had started some R&D activities.
References
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X-ray imaging with submicrometer resolution employing transparent luminescent screens
TL;DR: In this article, an x-ray detector based on a transparent, i.e., nonscattering, luminescent screen has been developed for phase contrast imaging and microtomography.
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Recent developments in X-ray imaging with micrometer spatial resolution.
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TL;DR: The first fast microtomography experiment including radiation hardness of the optic is shown, which uses a high-intensity white beam with 60 keV effective energy and a fast CCD camera at up to 60 frames s(-1).
Journal ArticleDOI
The ID23-2 structural biology microfocus beamline at the ESRF
David Flot,Trevor Mairs,Thierry Giraud,Matias Guijarro,Marc Lesourd,Vicente Rey,Denis van Brussel,Christian Morawe,Christine Borel,O. Hignette,Joel Chavanne,Didier Nurizzo,Sean McSweeney,Edward P. Mitchell +13 more
TL;DR: Beamline ID23-2, the first dedicated and highly automated high-throughput monochromatic macromolecular crystallography microfocus beamline, is described.
Journal ArticleDOI
The Diamond-NOM: A non-contact profiler capable of characterizing optical figure error with sub-nanometre repeatability
Simon G. Alcock,Kawal Sawhney,Stewart Scott,U. Pedersen,Rob Walton,Frank Siewert,Thomas Zeschke,F. Senf,T. Noll,Heiner Lammert +9 more
TL;DR: Diamond-NOM as discussed by the authors is a non-contact profiler capable of measuring the surface topography of large (up to 1500mm long) and heavy optical assemblies with sub-nanometre resolution and repeatability.
Proceedings ArticleDOI
The Nanometer Optical Component Measuring Machine: a new Sub-nm Topography Measuring Device for X-ray Optics at BESSY
TL;DR: The Nanometer Optical Component measuring Machine (NOM) has been developed at BESSY for the purpose of measuring the surface figure of optical components up to 12 m in length used at grazing incidence in Synchrotron Radiation beamlines.