A fast-Fourier-transform method of topography and interferometry is proposed. By computer processing of a noncontour type of fringe pattern, automatic discrimination is achieved between elevation and depression of the object or wave-front form, which has not been possible by the fringe-contour-generation techniques. The method has advantages over moire topography and conventional fringe-contour interferometry in both accuracy and sensitivity. Unlike fringe-scanning techniques, the method is easy to apply because it uses no moving components.

Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry

Course Description This is an advanced course in which we explore the field of Statistical Optics. Topics covered include such subjects as the statistical properties of natural (thermal) and laser light, spatial and temporal coherence, effects of partial coherence on optical imaging instruments, effects on imaging due to randomly inhomogeneous media, and a statistical treatment of the detection of light. Development of this more comprehensive model of the behavior of light draws upon the use of tools traditionally available to the electrical engineer, such as linear system theory and the theory of stochastic processes.

http://ieeexplore.ieee.org/iel5/3/23094/01073023.pdf

Statistical optics

Phase-contrast x-ray imaging (PCI) is an innovative method that is sensitive to the refraction of the x-rays in matter. PCI is particularly adapted to visualize weakly absorbing details like those often encountered in biology and medicine. In past years, PCI has become one of the most used imaging methods in laboratory and preclinical studies: its unique characteristics allow high contrast 3D visualization of thick and complex samples even at high spatial resolution. Applications have covered a wide range of pathologies and organs, and are more and more often performed in vivo. Several techniques are now available to exploit and visualize the phase-contrast: propagation- and analyzer-based, crystal and grating interferometry and non-interferometric methods like the coded aperture. In this review, covering the last five years, we will give an overview of the main theoretical and experimental developments and of the important steps performed towards the clinical implementation of PCI.

http://iopscience.iop.org/article/10.1088/0031-9155/58/1/R1/pdf

X-ray phase-contrast imaging: from pre-clinical applications towards clinics

This self-contained, comprehensive book describes the fundamental properties of soft x-rays and extreme ultraviolet (EUV) radiation and discusses their applications in a wide variety of fields, including EUV lithography for semiconductor chip manufacture and soft x-ray biomicroscopy. The author begins by presenting the relevant basic principles such as radiation and scattering, wave propagation, diffraction, and coherence. He then goes on to examine a broad range of phenomena and applications. The topics covered include EUV lithography, biomicroscopy, spectromicroscopy, EUV astronomy, synchrotron radiation, and soft x-ray lasers. He also provides a great deal of useful reference material such as electron binding energies, characteristic emission lines and photo-absorption cross-sections. The book will be of great interest to graduate students and researchers in engineering, physics, chemistry, and the life sciences. It will also appeal to practicing engineers involved in semiconductor fabrication and materials science.

X-Rays and Extreme Ultraviolet Radiation: Principles and Applications

We present an overview of solar flares and associated phenomena, drawing upon a wide range of observational data primarily from the RHESSI era Following an introductory discussion and overview of the status of observational capabilities, the article is split into topical sections which deal with different areas of flare phenomena (footpoints and ribbons, coronal sources, relationship to coronal mass ejections) and their interconnections We also discuss flare soft X-ray spectroscopy and the energetics of the process The emphasis is to describe the observations from multiple points of view, while bearing in mind the models that link them to each other and to theory The present theoretical and observational understanding of solar flares is far from complete, so we conclude with a brief discussion of models, and a list of missing but important observations

An Observational Overview of Solar Flares

Theoretical Approaches and Calculations.- X-Ray and Neutron Optical Systems.- The BESSY Raytrace Program RAY.- Neutron Beam Phase Space Mapping.- Raytrace of Neutron Optical Systems with RESTRAX.- Wavefront Propagation.- Theoretical Analysis of X-Ray Waveguides.- Focusing Optics for Neutrons.- Volume Effects in Zone Plates.- Nano-Optics Metrology.- Slope Error and Surface Roughness.- The Long Trace Profilers.- The Nanometer Optical Component Measuring Machine.- Shape Optimization of High Performance X-Ray Optics.- Measurement of Groove Density of Diffraction Gratings.- The COST P7 Round Robin for Slope Measuring Profilers.- Hartmann and Shack-Hartmann Wavefront Sensors for Sub-nanometric Metrology.- Extraction of Multilayer Coating Parameters from X-Ray Reflectivity Data.- Refection/Refraction Optics.- Hard X-Ray Microoptics.- Capillary Optics for X-Rays.- Reflective Optical Arrays.- Reflective Optical Structures and Imaging Detector Systems.- CLESSIDRA: Focusing Hard X-Rays Efficiently with Small Prism Arrays.- Multilayer Optics Developments.- Neutron Supermirror Development.- Stress Reduction in Multilayers Used for X-Ray and Neutron Optics.- Multilayers with Ultra-Short Periods.- Specially Designed Multilayers.- Diffraction Optics.- Diffractive-Refractive Optics: X-ray Crystal Monochromators with Profiled Diffracting Surfaces.- Neutron Multiple Reflections Excited in Cylindrically Bent Perfect Crystals and Their Possible use for High-Resolution Neutron Scattering.- Volume Modulated Diffraction X-Ray Optics.- High Resolution 1D and 2D Crystal Optics Based on Asymmetric Diffractors.- Thermal Effects under Synchrotron Radiation Power Absorption.

/pdf/modern-developments-in-x-ray-and-neutron-optics-3a5y8pr0ry.pdf

Modern developments in X-ray and neutron optics

The beamline “LUCIA” (line for ultimate characterization by imaging and absorption) is a “tender” (0.8–8 keV) X-ray microprobe with capabilities for chemical speciation by micro-X-ray absorption spectroscopy (μ-XAS) and for elemental mapping by X-ray micro-fluorescence (μ-XRF). It allows the possibility to study heterogeneous samples at a micrometer scale and to combine these two element-specific and non-destructive techniques. A monochromatic beam of a few micrometer in size is incident on a sample which is mounted on a scanning x–y–z stage. μ-XRF shows the location of the elements, their relative abundances, and their association with other elements. One can take advantage of the monochromatic beam which allows separating out different elements by their absorption edges. After mapping the fluorescence, spots of interest can be analysed by XAS to determine the speciation (local chemistry, quantitative determination of the local geometric structure around the absorbing atom) of the elements and how they depend on the different components. Installed at first at the SLS of the Paul Scherrer Institute (Switzerland), the LUCIA beamline will be transferred to SOLEIL by the beginning of 2008. The energy range offered by the beamline corresponds to the best performances of SLS and SOLEIL in terms of brightness. It allows XAS experiments at the K edge of elements ranging from Na to Fe, L edges from Ni to Gd, and M edges of rare earths and actinides.

LUCIA, a microfocus soft XAS beamline

Review of phase measuring deflectometry

In a previous paper, the University of Arizona (UA) has developed a measurement technique called: Software Configurable Optical Test System (SCOTS) based on the principle of reflection deflectometry. In this paper, we present results of this very efficient optical metrology method applied to the metrology of X-ray mirrors. We used this technique to measure surface slope errors with precision and accuracy better than 100 nrad (rms) and ~200 nrad (rms), respectively, with a lateral resolution of few mm or less. We present results of the calibration of the metrology systems, discuss their accuracy and address the precision in measuring a spherical mirror.

Non-null full field X-ray mirror metrology using SCOTS: a reflection deflectometry approach

We report, for the first time to our knowledge, experimental demonstration of wave-front analysis via the Hartmann technique in the extreme ultraviolet range. The reference wave front needed to calibrate the sensor was generated by spatially filtering a focused undulator beam with 1.7- and 0.6-microm-diameter pinholes. To fully characterize the sensor, accuracy and sensitivity measurements were performed. The incident beam's wavelength was varied from 7 to 25 nm. Measurements of accuracy better than lambdaEUV/120 (0.11 nm) were obtained at lambdaEUV = 13.4 nm. The aberrations introduced by an additional thin mirror, as well as wave front of the spatially unfiltered incident beam, were also measured.

Mourad Idir

Papers

Modern developments in X-ray and neutron optics

LUCIA, a microfocus soft XAS beamline

Review of phase measuring deflectometry

Non-null full field X-ray mirror metrology using SCOTS: a reflection deflectometry approach

Hartmann wave-front measurement at 13.4 nm with lambdaEUV/120 accuracy.