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Journal ArticleDOI

Cumulative Damage in Fatigue

Milton A. Miner
- 01 Sep 1945 - 
- Vol. 12, Iss: 3
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This article is published in Journal of Applied Mechanics.The article was published on 1945-09-01. It has received 4010 citations till now. The article focuses on the topics: Rainflow-counting algorithm.

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Recommendations for Fatigue Design of Welded Joints and Components

A. F. Hobbacher
TL;DR: In this paper, the authors present safety considerations for fatigue actions and fatigue assessment in a safety consideration framework, including fatigue actions, fatigue resistance, fatigue assessment, and fatigue resistance assessment.
Journal ArticleDOI

Cumulative fatigue damage and life prediction theories: a survey of the state of the art for homogeneous materials

Ali Fatemi, +1 more
- 01 Jan 1998 - 
TL;DR: A comprehensive review of cumulative fatigue damage theories for metals and their alloys, emphasizing the approaches developed between the early 1970s to the early 1990s, can be found in this paper, where the authors grouped these theories into six categories: linear damage rules, nonlinear damage curve and two-stage linearization approaches; life curve modification methods; approaches based on crack growth concepts; continuum damage mechanics models; and energy-based theories.
Journal ArticleDOI

Fatigue- a complex subject - some simple approximations

S. S. Manson
- 01 Jan 1965 - 
Journal ArticleDOI

Cumulative Damage in Fatigue: A Step towards Its Understanding:

R. H. W. Brook, +1 more
- 01 Jun 1969 - 
TL;DR: In this article, a method is described which uses changes of apparent dynamic modulus and damping during fatigue cycling, for estimating accurately the fatigue lives of stainless steel (Rex 535) specimens.
Journal ArticleDOI

Toward Reliable Power Electronics: Challenges, Design Tools, and Opportunities

Huai Wang, +2 more
- 14 Jun 2013 - 
TL;DR: The performance of power electronic systems, especially in terms of efficiency and power density, has continuously improved by the intensive research and advancements in circuit topologies, control schemes, semiconductors, passive components, digital signal processors, and system integration technologies.