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Proceedings ArticleDOI

Design of low-power on-line reconfigurable datapaths using self-checking circuits

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TLDR
A novel technique is illustrated to implement fault-tolerant circuits using on-line testing and a reconfiguration technique to by-pass the erroneous unit and a maximum of 40% is saved from the area required for integration, while 33% power reduction is achieved.
Abstract
In this paper, a novel technique is illustrated to implement fault-tolerant circuits. On-line testing is used to detect errors and a reconfiguration technique is applied to by-pass the erroneous unit. The main characteristics of this technique are the reduced power dissipation compared to formal implementations and the minimum required time to perform the reconfiguration process. Application of this technique on FIRs is illustrated and a maximum of 40% is saved from the area required for integration, while 33% power reduction is achieved.

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References
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A noncontact charger using a resonant converter with parallel capacitor of the secondary coil

TL;DR: In this article, a noncontact charging system using a resonant converter is presented, where the power transfer ability of a detachable transformer is improved by using a parallel capacitor connected to the secondary coil.
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Design and synthesis of self-checking VLSI circuits

TL;DR: Methods for the cost-effective design of combinational and sequential self-checking functional circuits and checkers are examined and the area overhead for all proposed design alternatives is studied in detail.
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A 30-ns 64-Mb DRAM with built-in self-test and self-repair function

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TL;DR: In this article, the authors examine the ways in which the yield of integrated circuit production can be improved through the use of circuit design techniques, focusing on fault-tolerant approaches but aspects of circuit layout are also briefly considered.