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Journal ArticleDOI

Epitaxial silicon carbide charge particle detectors

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TLDR
In this paper, Schottky detectors made on epitaxial layers of 4H silicon carbide were evaluated and the collection of the charge carriers was found to increase linearly with the square root of the applied reverse bias.
Abstract
The radiation detection properties of Schottky detectors made on epitaxial layers of 4H silicon carbide were evaluated. Exposure to 5.48 MeV alpha particles from a 241 Am source in vacuum led to robust signals from the detectors. The collection of the charge carriers was found to increase linearly with the square root of the applied reverse bias.

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Citations
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Journal ArticleDOI

Silicon carbide and its use as a radiation detector material

TL;DR: In this paper, a comprehensive review of the properties of epitaxial 4H silicon carbide polytype (4H-SiC) is presented, with particular emphasis on those aspects of this material related to room, high-temperature and harsh environment ionizing radiation detector operation.
Journal ArticleDOI

New materials for radiation hard semiconductor dectectors

TL;DR: In this paper, the authors present a review of the current status of research into new semiconductor materials for use as particle tracking detectors in very high radiation environments, carried out within the framework of the CERN RD50 collaboration, which is investigating detector technologies suitable for operation at the proposed Super-LHC facility.
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Study of silicon carbide for X-ray detection and spectroscopy

TL;DR: In this article, the performance in X-ray spectroscopy using planar diode and drift detectors in SiC has been estimated in a wide range of operating temperature (up to 150/spl deg/C).
Journal ArticleDOI

High-resolution alpha-particle spectrometry using 4H silicon carbide semiconductor detectors

TL;DR: In this paper, a linear energy response and excellent energy resolution have been obtained for various alpha emitters in the 3.18-MeV to 8.38-meV energy range.
Journal ArticleDOI

The fast neutron response of 4H silicon carbide semiconductor radiation detectors

TL;DR: In this article, fast neutron response measurements were reported for radiation detectors based on large-volume SiC p-i-n diodes, where multiple reaction peaks were observed for 14-MeV neutron reactions with the silicon and carbon nuclides in the SiC detector.
References
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Proceedings Article

Physics of semiconductor devices

S. M. Sze
Journal ArticleDOI

Metal Schottky barrier contacts to alpha 6H:SiC

TL;DR: In this paper, the Schottky barrier height φB during contact formation was obtained with x-ray photoemission spectroscopy; the electrical properties of subsequently formed thick contacts were characterized by currentvoltage and capacitance-voltage techniques.
Journal ArticleDOI

Study of characteristics of silicon detectors irradiated with 24 GeV/c protons between −20°C and +20°C

TL;DR: In this paper, the change of the diode reverse current, full depletion voltage and collection efficiency of the charge, deposited by relativistic electrons, are presented as a function of the proton fluence and of annealing time.
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Radiation damage due to niel in gaas particle detectors

TL;DR: In this article, a correlation between the observed reduction of charge collection efficiency (CCE) in GaAs particle detectors with the radiation dose from NIEL was demonstrated for detectors made from a wide range of material.
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Investigation of the radiation damage of GaAs detectors by neutrons and photons

TL;DR: In this article, surface barrier particle detectors, processed in Aachen using SI GaAs from several manufacturers, have been irradiated with neutrons (peak energy ∼ 1 MeV) up to fluences of 4.0 × 10 14 n/cm 2 and with photons from a 60 Co source with a dose of 100 Mrad.
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