Error Models of the Analog to Digital Converters
Linus Michaeli,Ján Šaliga +1 more
TLDR
A survey of error models starting from the structural models for the most common architectures and their linkage with the behavioral models represented by the simple look up table or the functional description of nonlinear errors for the output codes.Abstract:
Error models of the Analog to Digital Converters describe metrological properties of the signal conversion from analog to digital domain in a concise form using few dominant error parameters. Knowledge of the error models allows the end user to provide fast testing in the crucial points of the full input signal range and to use identified error models for post correction in the digital domain. The imperfections of the internal ADC structure determine the error characteristics represented by the nonlinearities as a function of the output code. Progress in the microelectronics and missing information about circuital details together with the lack of knowledge about interfering effects caused by ADC installation prefers another modeling approach based on the input-output behavioral characterization by the input-output error box. Internal links in the ADC structure cause that the input-output error function could be described in a concise form by suitable function. Modeled functional parameters allow determining the integral error parameters of ADC. Paper is a survey of error models starting from the structural models for the most common architectures and their linkage with the behavioral models represented by the simple look up table or the functional description of nonlinear errors for the output codes.read more
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A Universal Behavioral Model for COTS ADCs with Predictive Cold Temperature Performance Capability
Will Norton,Ziming Wang,Jordan Sangid,Roy Tan,Benjamin J. Blalock,Armian Hanelli,Jean Yang-Scharlotta,Miryeong Song,Mohammad Ashtijou,Mohammad Mojarradi +9 more
TL;DR: A temperature-predictive universal model for CMOS Nyquist-rate commercial-off-the-shelf (COTS) analog to digital converters (ADCs) to enable rapid model construction from readily available data sheet information without incurring extensive and costly overhead associated with data collection.
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Online Memory-Constrained Frequency Estimation for Low-Resolution Non-Linear ADCs
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Linearization of Non-Uniform Quantizers via Adaptive Non-Subtractive Dithering
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References
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TL;DR: This paper presents the converter as a black box, a guide to high-speed and high-resolution A/D and D/A converters, and some of the devices used in this converter, as well as some of their applications.
Book
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TL;DR: In this article, the converter as a black box is described, and the converter is compared with a black-box A/D converter and a high-resolution D/A converter.
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TL;DR: The standard will help incorporate evaluation considerations and test methods into the design and implementation processes and could produce substandard results.
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A. Jerng,Charles G. Sodini +1 more
TL;DR: In this article, a software-defined digital-RF modulator targeting Gb/s data rates is presented, which consists of a 2.625-GS/s digital DeltaSigma modulator, a 5.25 GHz direct digital RF converter, and a fourth-order auto-tuned passive LC RF bandpass filter.
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