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Journal ArticleDOI

New common-path phase shifting interferometer using a polarization technique.

Hiroshi Kadono, +2 more
- 01 Mar 1987 - 
- Vol. 26, Iss: 5, pp 898-904
TLDR
The present interferometer is different from a shearing type in that the phase distribution of an object beam is directly analyzed from the acquired intensity variations obtained by a 2-D detector such as a TV camera.
Abstract
A new type of phase shifting interferometer with a common-path arrangement using a polarization technique is proposed and discussed. In the interferometer, the dc (specular) component of an object beam is separated in the Fourier transform plane and used as a reference beam for its ac component. The phase of the dc component used as the reference beam is shifted by using a polarization technique for phase shifting interferometry. The present interferometer is different from a shearing type in that the phase distribution of an object beam is directly analyzed from the acquired intensity variations obtained by a 2-D detector such as a TV camera. Some experiments were conducted to verify the validity of the present phase shifting interferometer. They showed that high stability of the phase measurements is achieved up to λ/200 with an accuracy of λ/40 for wavelength λ light. The interferometer is suitable for obtaining 2-D phase information about the surface structure of small objects.

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Citations
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Journal Article

Digital wavefront measuring interferometer for testing optical surfaces and lenses

TL;DR: In this article, a self-scanned 1024 element photodiode array and a minicomputer are used to measure the phase (wavefront) in the interference pattern of an interferometer to lambda/100.
Journal ArticleDOI

Phase-evaluation methods in whole-field optical measurement techniques

TL;DR: The phase-evaluation methods as discussed by the authors use a combination of phase-shifted intensity values, provided by the modulation of one or several fringe patterns, to calculate the principal value of the optical phase.
Journal ArticleDOI

Superresolution optical system by common-path interferometry.

TL;DR: A novel approach consisting of attaching a diffraction grating in parallel together with the object in the input plane and using off-axis illumination provided by a Vertical Cavity Surface Emitting Lasers (VCSEL) array to allow us achieving a major improvement in the optical resolution limit with an extremely low penalty in the complexity of the resulting system.
Journal ArticleDOI

Common-path phase-shifting digital holographic microscopy: A way to quantitative phase imaging and superresolution

TL;DR: In this article, an experimental setup useful for complex amplitude evaluation and phase image quantification of three-dimensional (3-D) samples in digital holographic microscopy (DHM) is presented.
Journal ArticleDOI

Phase shifting common path interferometer using a liquid-crystal phase modulator

TL;DR: In this article, a common path phase shifting interferometer using a liquid-crystal cell as a phase modulator is proposed, which makes quantitative measurements possible as well as qualitative observations for phase objects like in a Zernike's phase contrast microscope.
References
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Journal ArticleDOI

A New Calculus for the Treatment of Optical SystemsI. Description and Discussion of the Calculus

TL;DR: In this paper, the effect of a plate of anisotropic material such as a crystal on a collimated beam of polarized light may always be represented mathematically as a linear transformation of the components of the electric vector of the light.
Journal ArticleDOI

A new calculus for the treatment of optical systems. IV

TL;DR: In this article, the general theory developed in Part I and the derivation of the matrices representing two optical elements which were not treated in Parts II and III are discussed. But the discussion is limited to monoclinic and triclinic crystals which do not possess optical activity.
Journal Article

Digital wavefront measuring interferometer for testing optical surfaces and lenses

TL;DR: In this article, a self-scanned 1024 element photodiode array and a minicomputer are used to measure the phase (wavefront) in the interference pattern of an interferometer to lambda/100.
Journal ArticleDOI

Digital Wavefront Measuring Interferometer for Testing Optical Surfaces and Lenses

TL;DR: The system has been designed to optimize the collection of data to give higher than usual accuracy in measuring the individual elements and final performance of assembled diffraction limited optical systems, and furthermore, the short loop time of a few minutes makes the system an attractive alternative to constraints imposed by test glasses in the optical shop.
Journal ArticleDOI

Installation et utilisation du comparateur photoélectrique et interférentiel du Bureau International des Poids et Mesures

P Carré
- 01 Jan 1966 - 
TL;DR: In this article, the photoelectric and interference comparator of the BIPM was described, together with its photoelectric microscopes, its installation (in particular, its anti-vibration mounting) and its auxiliary apparatus, including the interferometer, the refractometer and apparatus for temperature measurement.
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