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Journal ArticleDOI

Observation of Polymer Birefringence in Near-Field Optical Microscopy

TLDR
Birefringence, arising from locally preferred orientation of molecules or functional groups in polymeric and related materials has been observed in a near-field scanning optical microscope (NSOM).
Abstract
Birefringence, arising from locally preferred orientation of molecules or functional groups in polymeric and related materials has been observed in a near-field scanning optical microscope (NSOM) a...

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Polarized X-ray scattering reveals non-crystalline orientational ordering in organic films.

TL;DR: P-SoXS reveals scattering anisotropy in amorphous domains of all-polymer organic solar cells where interfacial interactions pattern orientational alignment in the matrix phase, which probably plays an important role in the photophysics.
Journal ArticleDOI

Characterization of organic thin film materials with near-field scanning optical microscopy (nsom)

TL;DR: In this paper, a review of the use of near-field scanning optical microscopy (NSOM) to characterize organic thin film materials is extensively reviewed, including polymer thin films, molecular aggregates, molecular crystals, molecular semiconductor heterojunctions, biological materials, and molecular mono-, bi-, and multi-layer films.
Journal ArticleDOI

Signatures of Intracrystallite and Intercrystallite Limitations of Charge Transport in Polythiophenes

TL;DR: In this paper, the role of structural parameters beyond the crystallinity on charge mobility in conjugated semicrystalline polymers has been investigated by varying the casting solvents and thermal annealing.
Journal ArticleDOI

Imaging organic device function with near-field scanning optical microscopy

TL;DR: In this paper, the authors surveyed the use of near-field scanning optical microscopy-based techniques to monitor and image physical processes related to device function in thin-film organic materials.
Journal ArticleDOI

Near-field scanning optical microscopy

TL;DR: In this article, near-field scanning optical microscopy (NSOM) is applied to a wide variety of materials, including semiconductors, molecular crystals, polymers and ceramics.
References
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Journal ArticleDOI

Optical stethoscopy: Image recording with resolution λ/20

TL;DR: In this paper, an extremely narrow aperture along a test object equipped with fine-line structures was used to demonstrate a resolving power of at least λ/20 which is to be compared with the values of λ 2.3 obtainable in conventional optical microscopy.
Journal ArticleDOI

Near-Field Optics: Microscopy, Spectroscopy, and Surface Modification Beyond the Diffraction Limit

Eric Betzig, +1 more
- 10 Jul 1992 - 
TL;DR: The near-field optical interaction between a sharp probe and a sample of interest can be exploited to image, spectroscopically probe, or modify surfaces at a resolution inaccessible by traditional far-field techniques, resulting in a technique of considerable versatility.
Journal ArticleDOI

Near‐field magneto‐optics and high density data storage

TL;DR: In this paper, near-field scanning optical microscopy (NSOM) has been used to image and record domains in thin-film magneto-optic (MO) materials.
Journal ArticleDOI

Polymer dispersed nematic liquid crystal for large area displays and light valves

TL;DR: In this paper, it was shown that the macroscopic electro-optical properties of the liquid crystal film can be modeled if the distribution of liquid-crystal droplet sizes is known.
Journal ArticleDOI

Near-Field Spectroscopy of the Quantum Constituents of a Luminescent System

TL;DR: Near-field microscopy/spectroscopy provides a means to access energies and homogeneous line widths for the individual eigenstates of these centers, and thus opens a rich area of physics involving quantum resolved systems.
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