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Se-loss-induced CIS Thin Films in RTA Process after Co-sputtering Using CuSe2 and InSe2 Targets

Nam-Hoon Kim, +2 more
- 01 May 2014 - 
- Vol. 9, Iss: 3, pp 1009-1015
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TLDR
Chalcopyrite CuInSe2 (CIS) thin films were prepared without Se- / S-containing gas by co-sputtering using CuSe2 and InSe2 selenide-targets and rapid thermal annealing as discussed by the authors.
Abstract
Chalcopyrite CuInSe2 (CIS) thin films were prepared without Se- / S-containing gas by co-sputtering using CuSe2 and InSe2 selenide-targets and rapid thermal annealing. The grain size increased to a maximum of 54.68 nm with a predominant (112) plane. The tetragonal distortion parameter η decreased and the inter-planar spacing d(112) increased in the RTA-treated CIS thin films annealed at a 400°C, which indicates better crystal quality. The increased carrier concentration of RTA-treated p-type CIS thin films led to a decrease in resistivity due to an increase in Cu composition at annealing temperatures ≥ 350°C. The optical band gap energy (Eg) of CIS thin films decreased to 1.127 eV in RTA-treated CIS thin films annealed at 400°C due to the improved crystallinity, elevated carrier concentration and decreased In composition.

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Citations
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Journal ArticleDOI

Deviations from stoichiometry and molecularity in non-stoichiometric Ag-In-Se thin films: Effects on the optical and the electrical properties

TL;DR: In this article, non-stoichiometric Ag-In-Se (AIS) thin films were prepared using co-sputtering with InSe2 and Ag targets followed by rapid thermal annealing.

Annealing effect on structural and electrical properties of thermally evaporated $Cd_{1-x}Mn_{x}S$ nanocrystalline films

TL;DR: In this article, thin films of Cd1-xMnxS (0 <= x <= 0.5) were deposited on glass substrates by thermal evaporation and all the films were deposited at 300 K and annealed at 573 K.
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Cu(In,Ga)Se2:Te Thin Films for Stoichiometric Compensation by Using Co-Sputtering and Rapid Thermal Annealing

TL;DR: In this article , the CIGS:Te thin films were used as absorbers and showed improved optical properties compared to the conventional CIGs thin films, with Eg = 1.548 eV and the deviation parameter (Δs) from the stoichiometry and normalized stoichiometric deviations of Se + Te and In + Ga were largely consistent with the behavior of thin-film properties.
References
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Book

Elements of X-ray diffraction

TL;DR: In this article, the authors present a chemical analysis of X-ray diffraction by Xray Spectrometry and phase-diagram Determination of single crystal structures and phase diagrams.
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III. Dislocation densities in some annealed and cold-worked metals from measurements on the X-ray debye-scherrer spectrum

TL;DR: In this article, two basic equations are derived for deducing the dislocation density in powdered materials from the particle size and strain breadth measured from the Debye-Schemer spectrum.
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SHORT COMMUNICATION: ACCELERATED PUBLICATION: Multicrystalline silicon solar cells exceeding 20% efficiency

TL;DR: In this article, the authors presented the first conversion efficiency above 20% for a multicrystalline silicon solar cell, where the application of wet oxidation for rear surface passivation significantly reduced the process temperature and therefore prevented the degradation of minority-carrier lifetime.
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