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Journal ArticleDOI

Texture, residual stress and structural analysis of thin films using a combined X-ray analysis

TLDR
In this article, a full approach has been developed integrating novel texture and residual stress methodologies with the Rietveld method (Acta Cryst. 22 (1967) 151) (for crystal structure analysis) and it has been coupled with the reflectivity analysis.
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This article is published in Thin Solid Films.The article was published on 2004-02-22. It has received 393 citations till now. The article focuses on the topics: Texture (crystalline) & Residual stress.

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Citations
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Journal ArticleDOI

Total pattern fitting for the combined size-strain-stress-texture determination in thin film diffraction

TL;DR: A global approach has been developed to analyze complex thin film structures by X-ray diffraction as mentioned in this paper, which is based on the fitting of multiple data, diffraction pattern and/or images collected at different orientation of the sample to obtain all the information needed.
Journal ArticleDOI

Synthesis and shape control of CuInS(2) nanoparticles.

TL;DR: The synthetic procedure turned out to be suitable to synthesize also other compounds, like CuInS(2)-ZnS alloys, and to modify, in this way, the optical properties of the nanocrystals.
Journal ArticleDOI

On the Thermal and Thermodynamic (In)Stability of Methylammonium Lead Halide Perovskites.

TL;DR: The measurements demonstrate that all the materials decompose to the corresponding solid lead (II) halide and gaseous methylamine and hydrogen halide, and the decomposition is well detectable even at moderate temperatures (~60 °C).
Journal ArticleDOI

In situ observation of texture evolution during α → β and β → α phase transformations in titanium alloys investigated by neutron diffraction

TL;DR: In this paper, texture changes during recrystallization and the α-β-α phase transformation in two titanium alloys were investigated in situ by time-of-flight neutron diffraction by heating in a vacuum furnace to 950°C.
References
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Book

Texture analysis

TL;DR: The geometric, random field, fractal, and signal processing models of texture are presented and major classes of texture processing such as segmentation, classification, and shape from texture are discussed.
Book

Residual Stress: Measurement by Diffraction and Interpretation

TL;DR: In this paper, the authors proposed a method to measure residual stress from X-ray diffraction data. But, their method is not suitable for the analysis of nonlinear elasticity theory.
Book

X-Ray and Neutron Reflectivity: Principles and Applications

TL;DR: In this paper, the interaction of X-Rays and Neutron with matter is discussed and applications of statistical physics at Crystal Surfaces (By A. Sentenac, J. Daillant, A. Menelle).
Journal ArticleDOI

Method for the simultaneous determination of anisotropic residual stresses and texture by x‐ray diffraction

TL;DR: In this article, a method was developed that yields the residual stress, the orientation distribution coefficients, the average crystallite dimension, the microstrain, and the crystal structure parameters from x-ray diffraction data in a single step procedure.
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