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Journal ArticleDOI

The Fourier Transform and Its Applications

Ronald N. Bracewell, +1 more
- 01 Aug 1966 - 
- Vol. 34, Iss: 8, pp 712-712
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This article is published in American Journal of Physics.The article was published on 1966-08-01. It has received 2834 citations till now. The article focuses on the topics: Fourier transform.

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Measuring the Lamellarity of Giant Lipid Vesicles with Differential Interference Contrast Microscopy

TL;DR: This work presents what they believe to be a novel label-free optical method to determine the lamellarity of giant vesicles based on quantitative differential interference contrast (qDIC) microscopy, which requires neither sample-dependent calibration nor sample staining, and thus can measure the lameLLarity of any giant vESicle without additional preparation or interference with subsequent investigations.
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Derivation of bolometer equations relevant to operation in fusion experiments

TL;DR: An overview of the bolometer diagnostic in the W7-AS stellarator is presented in this paper, where the equations for bolometer calibration and measurement, taking into account the cable resistance and capacitance between amplifier and detector, are derived.
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Vertical Gradients of Sunspot Magnetic Fields

TL;DR: In this article, the vertical gradient of the line-of-sight magnetic field component of a sunspot was calculated from coordinated observations of photospheric and transition-region fields.
Journal ArticleDOI

Determination of peptide and protein ion charge states by Fourier transformation of isotope-resolved mass spectra.

TL;DR: An automated method for determining charge states from high-resolution mass spectra, enabling the subsequent automated identification of singly-through quadruply-charged peptide ions, while reducing the numbers of conflicting identifications from ambiguous charge state assignments is reported.
Journal ArticleDOI

Direct retrieval of a complex wave from its diffraction pattern

TL;DR: In this paper, the exit surface wave function from a diffraction pattern is recovered from the diffraction patterns, which can be used to obtain structural information about the sample, and the wave function is then used to reconstruct the structure of the sample.