Journal ArticleDOI
Thermoelectric power of metallic films in the Mayadas-Shatzkes model
C.R. Tellier,A.J. Tosser +1 more
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In this article, general theoretical expressions of the thermoelectric power of metallic films were deduced from the Mayadas-Shatzkes conduction model of monocrystalline and polycrystalline films.About:
This article is published in Thin Solid Films.The article was published on 1977-03-01. It has received 38 citations till now. The article focuses on the topics: Thermoelectric effect & Seebeck coefficient.read more
Citations
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Phase purity and the thermoelectric properties of Ge2Sb2Te5 films down to 25 nm thickness
TL;DR: In this article, the authors measured the Seebeck and Thomson coefficients of Ge2Sb2Te5 films with thickness down to 25nm and showed that the Seeck coefficient reduces from 371μV/K to 206μV /K as the crystalline fraction increases by a factor of four as quantified using x-ray diffraction.
Journal ArticleDOI
Unexpected size effect in the thermopower of thin-film stripes
TL;DR: In this article, it was shown that in centimeter-long stripes of 100nm-thick metallic thin films, a reduction of the absolute value of thermopower occurs when the stripe width is in the order of 30-50 μm, which is 100-1000 times larger than the intrinsic mean free path of the material.
Journal ArticleDOI
Description of electronic transport properties of monocrystalline films by a statistical model
C.R. Tellier,A.J. Tosser +1 more
TL;DR: In this paper, the effects of electronic scattering are calculated by means of Matthiessen's rule starting from the electronic mean free path related to a particular type of scattering (bulk, grain boundary, external surface).
Journal ArticleDOI
Some transport properties of transition metal films
TL;DR: In this article, the experimental measurements reported on the electrical resistivity, temperature coefficient of resistance and thermoelectric power of nineteen transition metal films have been reviewed, and theoretical models proposed so far to analyse these experimental results have been briefly summarized.
Journal ArticleDOI
Electrical and mechanical properties of thin metal films: Size effects
TL;DR: A general expression for the function of electron scattering in thin films of a grain structure is derived which takes account of both the external and internal size effects as mentioned in this paper, and particular values of this function are given for polycrystalline and single-crystal films.
References
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Electrical-Resistivity Model for Polycrystalline Films: the Case of Arbitrary Reflection at External Surfaces
A. F. Mayadas,M. Shatzkes +1 more
TL;DR: In this paper, the total resistivity of a thin metal film is calculated from a model in which three types of electron scattering mechanisms are simultaneously operative: an isotropic background scattering (due to the combined effects of phonons and point defects), scattering due to a distribution of planar potentials (grain boundaries), and scattering by the external surfaces.
Journal ArticleDOI
Electron transport properties of thin copper films. I.
TL;DR: In this paper, a critical analysis of the observed size effects in all cases depart markedly from the predictions of the Fuchs-Sondheimer theory (and also that of the Mayadas-Shatzkes theory which takes into account the grain boundary surface scattering).
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Electrical-Resistivity Model for Polycrystalline Films: the Case of Arbitrary Reflection at External Surfaces
A. F. Mayadas,M. Shatzkes +1 more