Journal ArticleDOI
Variation of optical, structural, electrical and compositional properties of thermally evaporated CdTe thin films due to substrate temperature
TLDR
In this paper, polycrystalline CdTe thin films were deposited using thermal evaporation technique under different substrate temperatures from 125 to 300 °C, and the optical, structural, compositional, morphological and electrical properties were studied using UV-visible spectroscopy, GIXRD, EDX, SEM and van der Pauw method, respectively.Abstract:
Alteration of substrate temperature of thermally evaporated CdTe thin films can cause changes to the film structure and composition, affecting its optical, electrical as well as morphological properties. In this respect, polycrystalline CdTe thin films were deposited using thermal evaporation technique under different substrate temperatures from 125 to 300 °C. The optical, structural, compositional, morphological and electrical properties were studied using UV–visible spectroscopy, GIXRD, EDX, SEM and van der Pauw method, respectively. Optical measurements revealed that the band gap of the films slightly increase with increasing substrate temperature. Structurally, the lattice parameter and the crystallite size of the CdTe films deposited under a substrate temperature of 200 °C was found to be considerably higher than the rest of the substrate temperatures investigated. Texture coefficient indicate that the (111) plane becomes preferable as the substrate temperature is elevated to 300 °C. The lowest electrical resistivity was also found for samples deposited under a substrate temperature of 200 °C. Furthermore, EDX results reveals the composition of CdTe film considerably vary with respect to the substrate temperature at which the film was fabricated.read more
Citations
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Journal ArticleDOI
Effect of post deposition heat treatment on microstructure parameters, optical constants and composition of thermally evaporated CdTe thin films
TL;DR: In this article, the structural and optical properties of CdTe thin films were investigated at different annealing temperatures from 200 to 500°C, and the authors concluded that films annealed at 400°C can be the best films for photovoltaic applications.
Journal ArticleDOI
Thermally evaporated CdTe thin films for solar cell applications: Optimization of physical properties
TL;DR: In this article, CdTe thin films were fabricated using thermal evaporation technique at different substrate temperatures from 125 to 300°C and subjected to post deposition air annealing and chemical etching to observe the alterations of structural, optical and electrical properties.
Journal ArticleDOI
A study on the enhancement of opto-electronic properties of CdS thin films: seed-assisted fabrication
Journal ArticleDOI
Growth and characterization of EDTA assisted CBD-CdS
W.G.C. Kumarage,R.P. Wijesundera,V.A. Seneviratne,C.P. Jayalath,T. Varga,M.I. Nandasiri,B.S. Dassanayake +6 more
TL;DR: In this paper, chemical bath deposition of CdS (CBD-CdS) thin films with the assistance of a cationic surfactant, ethylenediamine tetraacetic acid (EDTA), is reported.
Journal ArticleDOI
Influence of thickness on crystallographic, stereometric, optoelectronic, and electrochemical characteristics of electron-beam deposited indium tin oxide thin films
TL;DR: In this article, the thickness variations of ITO films during deposition onto a substrate of glass through the electron beam evaporation method could influence the main features of the films, besides optoelectronic, crystallographic and stereometric analyses of surface morphology, electrochemical investigations of the film were performed.
References
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Book
Scanning Electron Microscopy and X-Ray Microanalysis
Joseph I. Goldstein,Dale E. Newbury,J. R. Michael,Nicholas W. M. Ritchie,John Henry J. Scott,David C. Joy +5 more
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Scanning electron microscopy and x-ray microanalysis
Graham Lawes,A. M. James +1 more
TL;DR: SEM-Instrumentation: Introduction Principles of Operation Specimen/Electron Interactions Detectors Operating Conditions and Limitations Specimen Preparation: Specimen Characteristics Drying Techniques Coating Cryo-SEM SEM X-Ray Microanalysis Instrumentation as mentioned in this paper.
Journal ArticleDOI
Williamson-Hall analysis in estimation of lattice strain in nanometer-sized ZnO particles
TL;DR: In this paper, the root mean square strain was determined from the interplanar spacing and strain estimated from the three models, viz, uniform deformation model, unweighted deformation stress model, and uniform density model.
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Thin Film Analysis by X-Ray Scattering
TL;DR: Birkholz et al. as discussed by the authors proposed a line profile analysis for X-ray diffraction and showed that line profiles can be used to detect residual stress gradients in thin films.